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LM-STEM Study of Dislocations in Thick Silicon
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 190-191
- Print publication:
- July 2009
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A Copper Leadframe Oxidation Investigation by Electron Energy-Loss Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1100-1101
- Print publication:
- August 2000
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Point Defect Supersaturation During Zinc Diffusion into InP
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- Journal:
- MRS Online Proceedings Library Archive / Volume 378 / 1995
- Published online by Cambridge University Press:
- 26 February 2011, 183
- Print publication:
- 1995
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