6 results
Influence of Nonlinear Intensity Attenuation in Bright-Field TEM Images on Tomographic Reconstructions of Micron-Scaled Materials
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 993-994
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Rotation Measure and Opacity Asymmetry in 2134+004
-
- Journal:
- Publications of the Astronomical Society of Australia / Volume 20 / Issue 1 / 2003
- Published online by Cambridge University Press:
- 05 March 2013, pp. 144-146
-
- Article
-
- You have access
- Export citation
Homoepitaxial growth of high quality thick diamond film with microwave plasma CVD technique
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1282 / 2011
- Published online by Cambridge University Press:
- 02 March 2011, mrsf10-1282-a05-18
- Print publication:
- 2011
-
- Article
- Export citation
Dielectric breakdown Characteristics of poly-Si/HfAlOx/SiON gate stack
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 811 / 2004
- Published online by Cambridge University Press:
- 28 July 2011, D2.7
- Print publication:
- 2004
-
- Article
- Export citation
In-Process Diagnostic System for Semiconductor Materials Using UHV Wafer Transfer Chamber
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 324 / 1993
- Published online by Cambridge University Press:
- 22 February 2011, 293
- Print publication:
- 1993
-
- Article
- Export citation
Fatigue Properties of SPF/DB Joints in 7475 Aluminum Alloy and Ti-6A1-4V Alloy
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 196 / 1990
- Published online by Cambridge University Press:
- 16 February 2011, 295
- Print publication:
- 1990
-
- Article
- Export citation