11 results
X-ray imaging of silicon die within fully packaged semiconductor devices
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- Journal:
- Powder Diffraction / Volume 36 / Issue 2 / June 2021
- Published online by Cambridge University Press:
- 30 March 2021, pp. 78-84
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X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers
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- Powder Diffraction / Volume 28 / Issue 2 / June 2013
- Published online by Cambridge University Press:
- 19 April 2013, pp. 95-99
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X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers
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- Powder Diffraction / Volume 25 / Issue 2 / June 2010
- Published online by Cambridge University Press:
- 29 February 2012, pp. 99-103
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An Evaluation of an Automated Detection Algorithm to Count Defects Present in X-Ray Topographical Images of SiC Wafers
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- MRS Online Proceedings Library Archive / Volume 994 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 0994-F11-13
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- 2007
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White Beam Synchrotron X-ray Topography and X-ray Diffraction Measurements of Epitaxial Lateral Overgrowth of GaN
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- MRS Online Proceedings Library Archive / Volume 693 / 2001
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- 21 March 2011, I3.27.1
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- 2001
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Investigation of Mechanical Stresses in Underlying Silicon due to Lead-Tin Solder Bumps via Synchrotron X-Ray Topography and Finite Element Analysis
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- MRS Online Proceedings Library Archive / Volume 682 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, N5.7
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- 2001
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Synchrotron X-ray Topography Studies of Epitaxial Lateral Overgrowth of GaN on Sapphire
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- MRS Online Proceedings Library Archive / Volume 572 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 327
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- 1999
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Epitaxial Lateral Overgrowth of Gallium Arsenide Studied by Synchrotron Topography
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- MRS Online Proceedings Library Archive / Volume 570 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 181
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- 1999
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The Use of X-ray Topography to Map Mechanical, Thermomechanical and Wire-Bond Strain Fields in Packaged Integrated Circuits
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- MRS Online Proceedings Library Archive / Volume 505 / 1997
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- 10 February 2011, 241
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- 1997
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An Examination of the Crystalline Quality of 200mm Diameter Silicon Substrates using X-ray Topography
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- MRS Online Proceedings Library Archive / Volume 469 / 1997
- Published online by Cambridge University Press:
- 15 February 2011, 83
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- 1997
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Synchrotron x-Ray Topographic Study Of Dislocations In Gaas Detector Crystals Grown By Vertical Gradient Freeze Technique
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- Journal:
- MRS Online Proceedings Library Archive / Volume 487 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 459
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- 1997
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