Powder Diffraction: Volume 18 -

$Published on behalf of International Centre for Diffraction Data$

Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 18 - June 2003

Contents

Page 7 of 10

Denver X-Ray Conference

D060 Synchrotron X-ray Phase Radiography and Absorption Micro-CT of Regenerating Newt Limbs
S. R. Stock, M. Gradassi, H. G. Simon, K. Ignatiev, I. Smolsky, H. Tsuruta, F. De Carlo
Published online by Cambridge University Press:

20 May 2016, p. 176
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C07 Synchrotron Applications in Archaeometallurgy: Analysis of High Zinc Brass Astrolabes
B. Newbury, M. Notis, G. S. Cargill III, B. Stephenson, J. Almer, D. Haeffner, B. Stephenson
Published online by Cambridge University Press:

20 May 2016, p. 176
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D037 In Situ Measurement of Growth Stress in Alumina Scale — Invited
E. D. Specht, P. F. Tortorelli, K. L. More, P. Zschack
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20 May 2016, p. 176
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D075 Precipitation Kinetics and Deformation Behavior of TIAL-W Alloys at Elevated Temperatures — Invited
H. Choo, D. Seo, J. Beddoes, M. A. M. Bourke
Published online by Cambridge University Press:

20 May 2016, p. 176
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D051 Shock-Induced Deformation of Tungsten Powder
D. W. Richards, M. P. Kramer, J. W. House, D. P. Shea, D. A. Cunard, R. J. De Angelis
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20 May 2016, p. 176
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D053 Relaxation of Residual Stress in Shot Peened Ti-6A1-4V Due to Fretting Fatigue
S. A. Martinez, S. Sathish, S. Mall, M. P. Blodgett
Published online by Cambridge University Press:

20 May 2016, p. 176
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D099 Powder Diffraction Pattern of Oriented Magnetic Particles Induced by Magnetic Field
X. Luo, S. Liu
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20 May 2016, p. 176
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D123 Strain Effects in Thin Film / SI Substrates Revealed by X-ray Microdiffraction
C. E. Murray, I. C. Noyan, B. Lai, Z. Cai
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20 May 2016, p. 176
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D082 Residual Stresses in Thin TaNx/Ta Bilayers: Origin and Evolution
K. J. Kozaczek
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20 May 2016, p. 176
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F45 The Perspective of TXRF for Environmental Analysis - Invited
S. Török, J. Osán, B. Beckhoff, G. Ulm, E. Curis
Published online by Cambridge University Press:

20 May 2016, p. 177
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F27 Elemental Imaging of Sea Urchin Tooth
G. J. Havrilla, T. C. Miller, S. Stock
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20 May 2016, p. 177
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F36 Focused Beam TXRF System Using Doubly Curved Crystals — Invited
Z. W. Chen
Published online by Cambridge University Press:

20 May 2016, p. 177
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F04 Characterization of Urban Air Pollution by Total Reflection X-ray Fluorescence
M. Schmeling
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20 May 2016, p. 177
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F09 TXRF Analysis Using Nanoliter Droplet Methodology in Semiconductor Applications
T. C. Miller, G. J. Havrilla, C. Sparks, M. Beebe
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20 May 2016, p. 177
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F23 A Novel TXRF Instrumentation for Contamination Control on 300 mm Silicon Wafers Employing Synchrotron Radiation
B. Beckhoff, R. Fliegauf, G. Ulm, J. Weser, T. Ehmann, L. Fabry, C. Mantler, S. Pahlke
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20 May 2016, p. 177
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F01 Depth Sensitive X-ray Fluorescence Analysis with X-ray Optics— Invited
B. Kanngießer, W. Malzer
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20 May 2016, p. 177
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C12 X-ray Optics: The Driving Force of New Technologies for X-ray Analysis— Invited
N. Gao, D. Gibson
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20 May 2016, p. 177
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F26 Stereoview Elemental X-ray Imaging
G. J. Havrilla, T. C. Miller, R. W. Morton, K. G. Huntley
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20 May 2016, p. 177
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C11 Beam Intensity/Detector Configuration Optimization with Numerical Methods
D. Kenning
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20 May 2016, p. 177
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D032 Microfocusing Source and Multilayer Optics Based SAXS Camera
L. Jiang, S. Seshadri, B. Verman, B. Kim, Y. Platonov
Published online by Cambridge University Press:

20 May 2016, p. 178
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Page 7 of 10

Powder Diffraction

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Volume 18 - June 2003

Denver X-Ray Conference

D060 Synchrotron X-ray Phase Radiography and Absorption Micro-CT of Regenerating Newt Limbs

C07 Synchrotron Applications in Archaeometallurgy: Analysis of High Zinc Brass Astrolabes

D037 In Situ Measurement of Growth Stress in Alumina Scale — Invited

D075 Precipitation Kinetics and Deformation Behavior of TIAL-W Alloys at Elevated Temperatures — Invited

D051 Shock-Induced Deformation of Tungsten Powder

D053 Relaxation of Residual Stress in Shot Peened Ti-6A1-4V Due to Fretting Fatigue

D099 Powder Diffraction Pattern of Oriented Magnetic Particles Induced by Magnetic Field

D123 Strain Effects in Thin Film / SI Substrates Revealed by X-ray Microdiffraction

D082 Residual Stresses in Thin TaNx/Ta Bilayers: Origin and Evolution

F45 The Perspective of TXRF for Environmental Analysis - Invited

F27 Elemental Imaging of Sea Urchin Tooth

F36 Focused Beam TXRF System Using Doubly Curved Crystals — Invited

F04 Characterization of Urban Air Pollution by Total Reflection X-ray Fluorescence

F09 TXRF Analysis Using Nanoliter Droplet Methodology in Semiconductor Applications

F23 A Novel TXRF Instrumentation for Contamination Control on 300 mm Silicon Wafers Employing Synchrotron Radiation

F01 Depth Sensitive X-ray Fluorescence Analysis with X-ray Optics— Invited

C12 X-ray Optics: The Driving Force of New Technologies for X-ray Analysis— Invited

F26 Stereoview Elemental X-ray Imaging

C11 Beam Intensity/Detector Configuration Optimization with Numerical Methods

D032 Microfocusing Source and Multilayer Optics Based SAXS Camera

Powder Diffraction

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Volume 18 - June 2003

Denver X-Ray Conference