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This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 4
Comparison of diffraction intensity using a monocapillary optic and pinhole collimators in a microdiffractometer with a curved image-plate
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- Published online by Cambridge University Press:
- 05 March 2012, pp. 94-98
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- Cited by 4
X-ray powder diffraction data for holmium nitrate pentahydrate
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- Published online by Cambridge University Press:
- 17 August 2012, pp. 203-207
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Measurement volume considerations in X-ray microdiffraction stress analysis
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- 06 March 2012, pp. 104-109
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Crystal structure of folic acid dihydrate, C29H29N2O6(H2O)2
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- 20 October 2014, pp. 52-56
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Synthesis and X-Ray Powder Diffraction Analysis of a New Metallic (but not Superconducting) Copper Oxide: La1.67Sr0.33Cu2O5
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- 10 January 2013, pp. 81-83
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X-ray powder diffraction data of hauyne with incommensurate modulated structure from volcanic rocks of Laacher Lake, Germany
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- 10 January 2013, pp. 3-6
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Study of the dielectric properties of ACu3Ti4O12 (A = Eu2/3, Tb2/3, and Na1/2Eu1/2)
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- 20 September 2019, pp. 345-351
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Synthesis and characterization of zinc sulfide hollow microspheres
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- 29 February 2012, pp. 24-28
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Powder Diffraction Data of CdTexSe1-xSolid Solutions
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- 10 January 2013, pp. 206-209
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Crystal structure of 3-methoxybenzanthrone from X-ray powder diffraction
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- 10 January 2013, pp. 133-135
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The Structure of Nanocrystalline Iron and Tungsten Powders Prepared by High-Energy Ball Milling
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- 06 March 2019, pp. 585-592
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Measurement of the silicon dioxide concentration in hafnium silicate gate dielectrics with a total reflection X-ray fluorescence spectroscopy
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- 01 March 2012, pp. 161-164
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Experimental Dispersing Devices and Detection Systems for Soft X-Rays
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- 06 March 2019, pp. 489-496
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Crystal Data for CuInTe2
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- 10 January 2013, pp. 43-46
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Accurate Modeling of Size and Strain Broadening in the Rietveld Refinement: The “Double-Voigt” Approach
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- 06 March 2019, pp. 397-404
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Monte Carlo simulation of projections in computed tomography
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- Published online by Cambridge University Press:
- 29 February 2012, pp. 150-153
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Quantitative Analysis of a Textured Coating by a New X-Ray Diffraction Method
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- 10 January 2013, pp. 89-94
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Rapid Recording of Powder Diffraction Patterns With Si(Li) X-Ray Energy Analysis System: W and Cu Targets and Error Analysis*
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- 06 March 2019, pp. 240-253
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Characterizing process semiconductor thin films with a confocal micro X-ray fluorescence microscope
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- 01 March 2012, pp. 145-147
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Progress in mineralogical quantitative analysis of rock samples: application to quartzites from Denali National Park, Alaska Range (USA)
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- 17 February 2016, pp. 31-39
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