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D-36 Grain Growth and Texture Sharpening in Copper, Nickel and Palladium Thin Films, Investigated by Non-Ambient X-ray Diffraction Measurements

Published online by Cambridge University Press:  20 May 2016

Y. Kuru ,
M. Wohlschlögel ,
U. Welzel  and
E. Mittemeijer
Y. Kuru
Affiliation:
Max Planck Institute for Metals Research, Stuttgart, Germany
M. Wohlschlögel
Affiliation:
Max Planck Institute for Metals Research, Stuttgart, Germany
U. Welzel
Affiliation:
Max Planck Institute for Metals Research, Stuttgart, Germany
E. Mittemeijer
Affiliation:
Max Planck Institute for Metals Research, Stuttgart, Germany
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Abstract

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Type
DENVER X-RAY CONFERENCE
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 174
Copyright
Copyright © Cambridge University Press 2008

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