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The Structural and Chemical Analyser – A New Analytical Technique for SEM

Published online by Cambridge University Press:  14 March 2018

A.D. Brooker*
Affiliation:
Renishaw plc, Gloucestershire, UK
T. Prusnick
Affiliation:
Renishaw Inc., Illinois, USA
R.M. Jarvis
Affiliation:
Department of Chemistry, UMIST, Manchester, UK
R. Goodacre
Affiliation:
Department of Chemistry, UMIST, Manchester, UK
R. Bennett
Affiliation:
Renishaw plc, Gloucestershire, UK
C.J. Dawe
Affiliation:
Renishaw plc, Gloucestershire, UK
D.J. Leak
Affiliation:
Renishaw plc, Gloucestershire, UK
M.R. Hill
Affiliation:
Renishaw plc, Gloucestershire, UK
M.J. Lainchbury
Affiliation:
Renishaw plc, Gloucestershire, UK

Extract

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Renishaw's structural and chemical analyser (SCA) provides new analytical techniques for scanning electron microscopes (SEM). For many years energy dispersive X-ray analysis (EDS) has been the default in-SEM analytical technique, and whilst it can provide fast and accurate data from any samples, it can only provide elemental information about the sample being analysed. For materials applications, assumptions about stoichiometry may enable accurate characterisation, but in most Instances “chemistry by guesswork” does not provide an acceptable solution. Furthermore, EDS is rather insensitive to light elements - atomic number 11 (sodium) and below, which severely limits its applicability to organic chemistry and life sciences.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2004