Hostname: page-component-8448b6f56d-tj2md Total loading time: 0 Render date: 2024-04-16T20:14:41.095Z Has data issue: false hasContentIssue false
  • English
  • Français

A Simple Method for Imaging DNA using SEM

Published online by Cambridge University Press:  14 March 2018

N. Chatterjee ,
K. Andresen ,
M. Thomas ,
L. Pollack  and
E. Kirkland
N. Chatterjee
Affiliation:
School of Applied and Engineering Physics
K. Andresen
Affiliation:
School of Applied and Engineering Physics
M. Thomas
Affiliation:
Cornell Center for Materials Research, Cornell University, Ithaca NY
L. Pollack
Affiliation:
School of Applied and Engineering Physics
E. Kirkland
Affiliation:
School of Applied and Engineering Physics

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

The intricate relationship between molecular structure and function is a common theme in molecular biology. Visualizing the structure of biological macromolecules through imaging is therefore useful in understanding their varied biological roles. The process is often complex; imaging in a high voltage Transmission Electron Microscope (TEM) involves extensive staining and freezing. The aim of this experiment was to image DNA easily in a close to natural environment in a simple microscope. Samples were imaged using a Leo (Zeiss) 1550 Scanning Electron Microscope (SEM) with a Schottky field emitter in the 15-30kV range to reduce radiation damage. After imaging off-the-shelf DNA, two more DNA samples were dialyzed with RbCl and NaCl and imaged to elucidate what made the DNA visible.

Type
Research Article
Information
Microscopy Today , Volume 16 , Issue 2 , March 2008 , pp. 38 - 39
Copyright
Copyright © Microscopy Society of America 2008

References

1 Bozzola John, J. and Russell, Lonnie Dee, “Electron Microscopy: Principles and Techniques for Biologists”, 2nd edition Jones & Bartlett (1998)Google Scholar
2 Das, R. et al., Phys. Rev. Lett. 90, 188103 (2003)CrossRefGoogle Scholar
3 Inaga, Sumire, Osatake, Hitoshi and Tanaka, Keiichi, J. Electron Micros., 40 (1991) p. 181-186.Google Scholar