Hostname: page-component-848d4c4894-xfwgj Total loading time: 0 Render date: 2024-06-29T01:30:32.959Z Has data issue: false hasContentIssue false

Signature Analysis applied to EDS microanalysis

Published online by Cambridge University Press:  14 March 2018

J. W. Colby
Affiliation:
xk, Incorporated, Clackamas, OR, 1
D. C. Ward*
Affiliation:
xk, Incorporated, Clackamas, OR, 1

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Most spectroscopies (FTIR, XRD, RAMAN, MS, etc.), were developed in order to identify materials. This is accomplished by capturing the spectral “signature” of an unknown and matching it to those of a comprehensive database of reference materials. Development of these spectroscopies has included efforts to embellish the associated database. EDS evolved as a resource to provide qual/quant, and development has been to improve the accuracy of quantation. Until recently, EDS was not considered a spectroscopy to provide identification of materials.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2008

Footnotes

References

2.The original spectral database for this project was heavily populated by the FBI. The database, as subsequently modified is provided with SLICE.Google Scholar