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SEM Remote Control with a 3D Option

Published online by Cambridge University Press:  14 March 2018

F. Mighela ,
C. Perra ,
R. Pintus ,
S. Podda  and
M. Vanzi
F. Mighela*
Affiliation:
Telemicroscopy Laboratory, Sardegna Ricerche, Edificio 3, Località Piscinamanna, Pula (CA), Italy
C. Perra
Affiliation:
DIEE, University of Cagliari, Piazza D’Armi, Cagliari, Italy
R. Pintus
Affiliation:
3D Model Laboratory, Sardegna Ricerche, Edificio 1, Località Piscinamanna, Pula (CA), Italy
S. Podda
Affiliation:
Telemicroscopy Laboratory, Sardegna Ricerche, Edificio 3, Località Piscinamanna, Pula (CA), Italy
M. Vanzi
Affiliation:
DIEE, University of Cagliari, Piazza D’Armi, Cagliari, Italy
*
francesca.mighela@diee.unica.it

Extract

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Remote control of a scientific instrument is a topic gaining more and more attention between instrument users and operators. The project presented in this article reports results obtained from two distinct research efforts. The main outcome from the first research was the realization of an application to remote-control a Scanning Electron Microscope (SEM), while the main outcome from the second research was the implementation of a procedure to reconstruct 3D surfaces.

Type
Research Article
Information
Microscopy Today , Volume 16 , Issue 4 , July 2008 , pp. 60 - 61
Copyright
Copyright © Microscopy Society of America 2008

References

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