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Insights on Diffraction

Published online by Cambridge University Press:  14 March 2018

Alwyn Eades
Alwyn Eades*
Affiliation:
Lehigh University
*
jae5@lehigh.edu

Extract

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This article presents ideas on some topics related to electron diffraction in the TEM. These are in regard to topics that I have come to think of as standard parts of what it means to do microscopy. However, they represent insights that not all users share (or even agree with, maybe).

Kikuchi lines are of great use in orienting a sample. Unfortunately, in modern microscopes, Kikuchi lines are not seen in selected-area diffraction (SAD). This is because immersion lenses send parallel electrons, from different parts of the sample (like the Kikuchi lines from a flat specimen), to different places in the diffraction pattern.

Type
Research Article
Information
Microscopy Today , Volume 10 , Issue 2 , March 2002 , pp. 34 - 35
Copyright
Copyright © Microscopy Society of America 2002

References

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J. C. H., Spence and Zuo, J. M., Electron Microdiffraction, Plenum (New York 1992)Google Scholar
Cowley, J. M. (Ed.) Electron Diffraction Techniques (2 volumes) Oxford (Oxford 1992)Google Scholar
2. Christenson, K. K. and Eades, J. A., Skew Thoughts on Parallelism Ultramicroscopy 26 (1988) 113–132 Google Scholar
3. Cowley, J.M., Diffraction Physics, North Holland (Amsterdam 1981) Chapter 12, 249-271Google Scholar
Gjonnes, J., Disorder and defect scattering, thermal diffuse scattering, and amorphous material, in Cowley, J. M. (Ed.) Electron Diffraction Techniques Oxford (1992) Volume 2, 223–259 Google Scholar
4. Support from DOE, under grant DE-FG02-00ER45819, is gratefully acknowledgedGoogle Scholar