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Heated-Tip AFM: Applications in Nanocomposite Polymer Membranes and Energetic Materials

Published online by Cambridge University Press:  14 March 2018

Jason P. Killgore ,
William King ,
Kevin Kjoller  and
René M. Overney
Jason P. Killgore
Affiliation:
Dept. of Chem. Eng., Univ. of Washington, Seattle, WA
William King
Affiliation:
Dept. of Mech. Sci. and Eng, Univ. of Illinois at Urbana-Champaign, IL
Kevin Kjoller*
Affiliation:
Anasys Instruments, Santa Barbara, CA
René M. Overney
Affiliation:
Dept. of Chem. Eng., Univ. of Washington, Seattle, WA
*
kevin@anasysinstruments.com

Extract

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Atomic Force Microscopy (AFM) is a key technique for the measurement and analysis of samples when nanoscale topography is of interest. It offers a number of complementary probing modes that extend an AFM's measurement capability to a wide range of material and transport properties of surfaces, including hardness, friction, conductivity and adhesion among others. Sample temperature controlled AFM extends the study of surface morphology and properties to include changes in the material phases.

Recently, silicon microfabricated AFM cantilevers that have integrated heaters, as shown in figure 1, have become commercially available. These cantilevers were initially developed for probe based data storage by researchers at IBM Zurich, Figure 1. With the availability of these cantilevers, AFM measurements can be performed where the tip is heated as opposed to the sample.

Type
Research Article
Information
Microscopy Today , Volume 15 , Issue 1 , January 2007 , pp. 20 - 25
Copyright
Copyright © Microscopy Society of America 2007

References

References:

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