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Gradient Reference Specimens for Advanced Scanned Probe Microscopy†

Published online by Cambridge University Press:  14 March 2018

Duangrut Julthongpiput ,
Michael J. Fasolka  and
Eric J. Amis
Duangrut Julthongpiput
Affiliation:
Polymers Division, Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg MD 20899
Michael J. Fasolka*
Affiliation:
Polymers Division, Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg MD 20899
Eric J. Amis
Affiliation:
Polymers Division, Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg MD 20899
*
*mfasolka@nist.gov

Extract

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Scanned Probe Microscopy (SPM) techniques are attractive because they provide easily acquired micrographs that map specimen properties with nanometer scale resolution. SPM micrographs can be collected without the use of high vacuum (as opposed to many electron microscopies). Moreover, SPM methods allow in-situ imaging of specimens in a variety of environments, including under liquids and at higher temperatures. However, from a metrology perspective, the great promise of SPM must be balanced by the fact that SPM techniques generally provide qualitative data unless supplementary actions are taken. That is, quantification of SPM image contrast is difficult since it depends highly upon probe characteristics, probe/ sample interactions (both of which can be difficult Eo gauge), and instrument calibration.

Type
Research Article
Information
Microscopy Today , Volume 12 , Issue 4 , July 2004 , pp. 48 - 51
Copyright
Copyright © Microscopy Society of America 2004

Footnotes

†

Contribution of the National Institute of Standards and Technology, not subject to copyright in the United States.

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