Skip to main content Accessibility help
×
Home

Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials

  • Jun-Sang Park (a1), Xuan Zhang (a2), Peter Kenesei (a1), Su Leen Wong (a3), Meimei Li (a2) and Jonathan Almer (a1)...
  • View HTML
    • Send article to Kindle

      To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

      Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

      Find out more about the Kindle Personal Document Service.

      Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials
      Available formats
      ×

      Send article to Dropbox

      To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

      Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials
      Available formats
      ×

      Send article to Google Drive

      To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

      Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials
      Available formats
      ×

Abstract

  • An abstract is not available for this content so a preview has been provided below. To view the full text please use the links above to select your preferred format.

Copyright

Corresponding author

References

Hide All
[1] Monteiro, SN and Paciornik, S, JOM 69(1) (2017) 8492.
[2] Maire, E and Withers, PJ, Int Mater Rev 59(1) (2013) 143.
[3] Newnham, RE, Properties of Materials; Anisostropy, Symmetry, Structure, Oxford University Press, New York, 2004.
[4] Poulsen, HF, J Appl Crystallogr 45(6) (2012) 10841097.
[5] Budai, J et al., Thin Solid Films 516(22) (2008) 80138021.
[6] Suter, R et al., J Eng Mater Technol 130(2) (2008) 021007021007-5.
[7] Ludwig, W et al., Rev Sci Instrum 80(3) (2009) 033905.
[8] Lienert, U et al., JOM 63(7) (2011) 7077.
[9] Beaudoin, A et al., Acta Mater 61(9) (2013) 34563464.
[10] Shade, PA et al., Rev Sci Instrum 86(9) (2015) 093902.
[11] Varlioglu, M et al., Texture, Stress, and Microstructure 2010 (2010) article ID 910793, 110.
[12] Oddershede, J et al., J Appl Cryst 48(3) (2015) 882889.
[13] Shastri, SD et al., J Synchrotron Rad 14 (2007) 204211.
[14] Said, A and Shastri, S, J Synchrotron Rad 17 (2010) 425427.
[15] Shastri, SD et al., Proc SPIE 9207, Advances in X-Ray/EUV Optics and Components IX 920704.
[16] Tavares, PF et al., J Synchrotron Rad 21 (2014) 862877.
[17] Zhang, X et al., Rev Sci Instrum 88(1) (2017) 015111.
[18] Lienert, U et al., Mater Sci Eng A 524(1-2) (2009) 4654.
[19] Park, J-S et al., Synchrotron Radiation News 30(3) (2017) 916.
[20] Shastri, SD, J Synchrotron Rad 11(2) (2004) 150156.
[21] Pantleon, W et al., Mater Sci Eng A 387389 (2004) 339342.
[22] Lee, J et al., Nuclear Instruments and Methods in Physics Research A 582(1) 182184.
[23] Park, J-S et al., J Mater Res 30(9) (2015) 13801391.
[24] Sørensen, HO et al., Zeitschrift fìr Kristallographie - Crystalline Materials 227(1) (2012) 6378.
[25] Bernier, JV et al., J Strain Anal Eng 46(7) (2011) 527547.
[26] Argonne National Laboratory, Advanced Photon Source, “MIDAS, Microstructural Imaging using Diffraction Analysis Software” https://www1.aps.anl.gov/Science/Scientific-Software/MIDAS (accessed July 24, 2017).
[27] Wozniak, JM et al., “Big data staging with MPI-IO for interactive x-ray science,” IEEE/ACM International Symposium on Big Data Computing, London, UK, Dec. 2014.
[28] Zhang, X et al., J Nucl Mater 471 (2016) 280288.
[29] Busby, J, “Advanced materials for nuclear reactor systems: Alloys by design to overcome past limitations,” International Conference on Fast Reactors and Related Fuel Cycles: Challenges And Opportunities (Fr09), Dec. 2009, Kyoto, Japan.
[30] Maziasz, PJ, JOM 41(7) (1989) 1420.
[31] Swindeman, R and Maziasz, P, “The mechanical and microstructural stability of austenitic stainless steels strengthened by MC-forming elements,” International Conference on Creep of Materials, Orlando, FL, May 1992.
[32] Pagan, DC and Miller, MP, Acta Mater 116 (2016) 200211.
[33] Wong, SL et al., Comp Mater Sci 77 (2013) 456466.

Far-Field High-Energy Diffraction Microscopy: A Non-Destructive Tool for Characterizing the Microstructure and Micromechanical State of Polycrystalline Materials

  • Jun-Sang Park (a1), Xuan Zhang (a2), Peter Kenesei (a1), Su Leen Wong (a3), Meimei Li (a2) and Jonathan Almer (a1)...

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed