All of us have looked at leaves. They're interesting. Some of us have looked at leaves under a light microscope. Still interesting. Some have looked at leaves under more powerful microscopes, and apparently they found it interesting still. Now some folks have looked more closely than ever before, and guess what? This may be the most interesting! Wendy Mechaber, Durwood Marshall, and Frances Chew of Tufts University, Richard Mechaber of GEI Consultants, Inc., and Renee Jobe of TopoMetrix turned to the atomic force microscope (AFM) to analyze the landscape of the surfaces of leaves, apparently for the first time.