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Calibrating the TEM

Published online by Cambridge University Press:  14 March 2018

John P. McCaffrey
John P. McCaffrey*
Affiliation:
National Research Council of Canada

Extract

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An accurate calibration of magnification, diffraction patterns and the relative rotation between the two is critical in quantitative transmission electron microscopy (TEM). The manufacturers of TEM's supply magnification values for each image magnification step and each value of camera length for their instruments, but these values have been observed to be in error by up to 10%, These errors can occur due to variations in lenses in individual microscopes as well as through power supply variations and aging electronic components. Before attempting quantitative TEM analysis, a series of calibrations of the individual TEU should be undertaken.

Type
Research Article
Information
Microscopy Today , Volume 5 , Issue 9 , November 1997 , pp. 16 - 17
Copyright
Copyright © Microscopy Society of America 1997

References

Backus, R.C. and Williams, R.C. (1948) "Small spherical particles of exceptionally uniform size". J. Appl. Phys., 20:224–225.Google Scholar
Dowell, W.C.T. (1964) "Die bestimmung der verge Be rung des elektronenmikroskops mittels elektroneninterferenz". Optik, 21:26–40.Google Scholar
Edington, J.W. (1976) Practical Electron Microscopy in Materials Science, (Van Nostrand Reinhold, New York), 21–30.Google Scholar
Mccaffrey, J.P. and Baribeau, J-M. (1995) "A transmission electron microscope (TEM) calibration standard sample for all magnification, camera constant and imagediffraction pattern rotation calibrations", Microscopy Research and Technique. 32 no.5, pp. 449–454.Google Scholar
C.F., Oster Jr. and Skillman, D.C., (1962) Proc. 5th Intern, Congr. for Electron Microscopy, vol.1, Academic Press, New York, (1962) EE-3-5.Google Scholar
Skinner, L.M. (1969) "An accurate method for measuring the magnification of an electron microscope". J. Phys. E, 2: 206–208.Google Scholar
South Bay Technology Inc., 1120 Via Callejon, San Ciemente, CA 92673, tel: (714) 492-2600, e-mail: , http://www.southbaytech.com Google Scholar
Wrigley, N.G. (1968), The lattice spacing of crystalline catalase as an internal standard of length in electron microscopy. J. Ultra structure Res., 24: 454–464.Google Scholar