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Calculation, Simulation, and Screen Graphic Display of Complex TED Patterns with the PC Program “Pattern”

Published online by Cambridge University Press:  14 March 2018

Corneliu Sårbu
Corneliu Sårbu*
Affiliation:
National Institute for Physics of Materials, Bucharest-Magurele, Romania

Extract

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It is well known to electron microscopists working in the field of materials structure research that the importance of transmission electron diffraction patterns (TED) is: (i) establishing the crystallographic orientation correlations revealed during the practical observation of multiphase specimens and (ii) the knowledge of exact crystallographic orientation of a single crystal area in the specimen relating to image contrast interpretation.

Type
Research Article
Information
Microscopy Today , Volume 6 , Issue 9 , November 1998 , pp. 16 - 17
Copyright
Copyright © Microscopy Society of America 1998

References

[1] Heidenreich, R.D., Fundamentals of Transmission Electron Microscopy, Interscience Publishers, New-York, 1964, p. 220. The subject is treated in many other fundamental books and manuals on TEM.Google Scholar
[2] Hirsch, P.B. et al, Electron Microscopy of Thin Crystals. Butterworths, London, 1965, § 6.2.Google Scholar
[3] Ploc, R.A. and Keech, G.H., Report AECL-3729, Chalk River Nuclear Labs., Chalk River. Ontario, Canada, 1971 Google Scholar
[4] Ploc, R.A., Report AECL-5556, Chalk River Nuclear Labs., Chalk Rirar, Ontario, Canada, 1976 Google Scholar
[5] Ploc, R.A. and Keech, G.H., Proc. 7-th Int. Cong. Electron Microsc., Grenoble, 1970, pp. 203-204Google Scholar
[6] Sarbu, C., Electron Microscopy 1988, (Proc. 14-th Int.. Cong. Electron Microsc. held in Cancun, Mexico, 31 Aug. to 4 Sept. 1998) volume 1, pp. 421-422Google Scholar