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Beam Skirt Effects When Doing EDS In An Low-Vacuum SEM

Published online by Cambridge University Press:  14 March 2018

J.B. Blide-Soerensen*
Affiliation:
Risoe National Laboratory, Denmark

Extract

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Approximately 75 % of the primary electrons will be scattered when you use a working distance of 12 mm and a pressure of 3.5 torr, and a significant fraction of these scattered electrons will hit the sample farther away from the beam target than 50 pm. (The scattered intensity is approximately given by Is/ lo = 1 – exp(-ρσL/kT) where p is the pressure, σ the total scattering cross section for electron scattering on the gas used, L the distance between the last pressure limiting aperture and the sample, k the Boltzmann constant and T the absolute temperature).

Type
Research Article
Copyright
Copyright © Microscopy Society of America 1998