Analytical Sciences Symposia
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
FIB Sample Preparation of Hybrid Organic-Inorganic Perovskite (HOIP) Solar Cells
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- Published online by Cambridge University Press:
- 22 July 2022, pp. 16-18
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Software and Instrumentation
Using Xe Plasma FIB for High-Quality TEM Sample Preparation
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- 15 March 2022, pp. 646-658
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Quantitative Assessment and Measurement of X-ray Detector Performance and Solid Angle in the Analytical Electron Microscope
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- 09 December 2021, pp. 83-95
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Analytical Sciences Symposia
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Taking Full Control: Leveraging Software Customizability and Open-Source Hardware to Tailor FIB Instrument Controls
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- 22 July 2022, pp. 20-21
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Software and Instrumentation
High-Energy Electron Scattering in Thick Samples Evaluated by Bright-Field Transmission Electron Microscopy, Energy-Filtering Transmission Electron Microscopy, and Electron Tomography
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- 28 March 2022, pp. 659-671
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Development and Computation
Understanding the Effects of Graphene Coating on the Electrostatic Field at the Tip of an Atom Probe Tomography Specimen
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- 30 July 2021, pp. 1054-1065
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Software and Instrumentation
PARROT: A Pilot Study on the Open Access Provision of Particle-Discrete Tomographic Datasets
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- 18 January 2022, pp. 350-360
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Materials Science Applications
Image-Based Analysis of Weathered Slag for Calculation of Transport Properties and Passive Carbon Capture
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- 04 July 2022, pp. 1514-1525
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Software and Instrumentation
Energy-Dispersive X-Ray Spectrum Simulation with NIST DTSA-II: Comparing Simulated and Measured Electron-Excited Spectra
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- 02 September 2022, pp. 1905-1916
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Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM
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- 25 April 2022, pp. 1526-1537
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Automated Tools to Advance High-Resolution Imaging in Liquid
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- 20 January 2022, pp. 361-370
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Development and Computation
PosgenPy: An Automated and Reproducible Approach to Assessing the Validity of Cluster Search Parameters in Atom Probe Tomography Datasets
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- 21 September 2021, pp. 1066-1075
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Analytical Sciences Symposia
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Applications of a Triple Beam Microscope in Materials Science
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- 22 July 2022, pp. 22-23
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Software and Instrumentation
Exploring Blob Detection to Determine Atomic Column Positions and Intensities in Time-Resolved TEM Images with Ultra-Low Signal-to-Noise
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- 28 March 2022, pp. 1917-1930
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Determining Grain Boundary Position and Geometry from EBSD Data: Limits of Accuracy
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- 15 November 2021, pp. 96-108
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Localized Phonon Densities of States at Grain Boundaries in Silicon
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- 16 March 2022, pp. 672-679
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Understanding the Nature of Crystallographic Bonds by Establishing the Correlation between Ion-Pair Chemistry and Their Separation in Detector Space
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- 15 March 2022, pp. 680-688
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A Feasible Surface Patterning Method for SEM-DIC: Achieving High-Resolution In Situ Mapping of Local Strain and Microstructure to Reveal the Effect of Slip Transfer on Shear Strain Near Grain Boundaries
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- 16 May 2022, pp. 1931-1944
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Development and Computation
Development of an Energy-Sensitive Detector for the Atom Probe Tomography
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- 20 September 2021, pp. 1076-1091
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Software and Instrumentation
Cluster Analysis of Combined EDS and EBSD Data to Solve Ambiguous Phase Identifications
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- 03 March 2022, pp. 371-382
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