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Volume 15 - Supplement S2 - July 2009

Contents

Page 31 of 39

Physical Sciences

Microscopy and Microanalysis of Nanostructured Materials

Abstract

  • A Microstructual Study of Architecturally-Controlled Pt-Ru Core/Shell and Alloy Nanoparticles

  • S Alayoglu, L-C Lai, W-A Chiou, B Eichhorn
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1206-1207
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Development of Protocols Suitable for Atomic-Scale Imaging of Catalyst Clusters at Catalytic Temperatures

  • L Germinario, LF Allard
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1208-1209
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Amorphous Structure and Stability of Mn Implanted GeC Ferromagnetic Semiconductor

  • C Sun, HC Floresca, J Wang, M Jamil, S Guchhait, DA Ferrer, SK Banerjee, G Lian, L Colombo, MJ Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1216-1217
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Energy Loss Spectroscopy Study on the Dielectric Response of Single H2Ti3O7 Nanotube

  • J Wang, Q Li, LM Peng, M Malac
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1218-1219
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In Situ Ultrahigh Vacuum Transmission Electron Microscope Investigations of Nanostructures

  • LJ Chen, W-W Wu
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1220-1221
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantum Wells in the Ternary System Zn(1-X)CdXSe by High Rresolution Microscopy

  • H Calderon, I Hernandez-Calderon, E Yucelen, B Freitag, S Peripolli, CA Achete
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1222-1223
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Microstructural Characterization of Sputter Deposited BaTiO3/Ni/BaTiO3/Ni/BaTiO3 Multi-layer Thin Films on SiO2/Si Wafers

  • M Zhang, JN Reck, FS Miller, MJ O'Keefe
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1224-1225
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Effect of Catalyst Composition on Si Nanowire Growth Kinetics

  • S Kodambaka, J Tersoff, C-Y Wen, M Reuter, E Stach, F Ross
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1226-1227
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • K-space Navigation for Accurate High-angle Tilting and Control of the TEAM Sample Stage

  • T Duden, V Radmilovic, A Schmid, U Dahmen
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1228-1229
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Structural Fingerprinting of Nanocrystals in the Transmission Electron Microscope

  • S Rouvimov, P Moeck, S Nicolopoulos
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1230-1231
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Orientation Imaging of Nanocrystalline Platinum Films in the TEM

  • A Darbal, K Barmak, NT Nuhfer, DJ Dingley, G Meaden, JR Michael, T Sun, B Yao, KR Coffey
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1232-1233
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Convenient Electron Optics Set Up for Zernike Phase Microscopy in TEM

  • M Kawasaki, M Malac, P Li, H Qian, R Egerton
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1234-1235
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Polarization Field Mapping of AlGaN/GaN HEMT Devices using Lorentz-mode Electron Holography

  • DA Cullen, DJ Smith, PL Fejes, MR McCartney
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1236-1237
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-line Holography of Embedded Nanoparticles in a TEM

  • L Livadaru, M Malac, R Wolkow
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1238-1239
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Measurements of Porous Networks in Low-k Dielectric by Three-dimensional Electron Tomography

  • P Ercius, HL Xin, DA Muller
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1240-1241
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Analysis Of “Invisible” Poly-Bump Defect With EFTEM Spectral Imaging

  • CT Schamp, R Rios, A Gill
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1242-1243
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Spatially Resolved Characterization of Interface Plasmons in Si/SiO2 Core/Shell Nanostructures

  • J Wang, X Wang, Y Jiao, Q Li, M-W Chu, M Malac
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1244-1245
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 31 of 39