Hostname: page-component-76fb5796d-5g6vh Total loading time: 0 Render date: 2024-04-26T20:45:07.792Z Has data issue: false hasContentIssue false
  • English
  • Français

Amorphous Structure and Stability of Mn Implanted GeC Ferromagnetic Semiconductor

Published online by Cambridge University Press:  26 July 2009

C Sun ,
HC Floresca ,
J Wang ,
M Jamil ,
S Guchhait ,
DA Ferrer ,
SK Banerjee ,
G Lian ,
L Colombo  and
MJ Kim
C Sun
Affiliation:
University of Texas,Dallas
HC Floresca
Affiliation:
University of Texas,Dallas
J Wang
Affiliation:
University of Texas,Dallas
M Jamil
Affiliation:
University of Texas,Austin
S Guchhait
Affiliation:
University of Texas,Austin
DA Ferrer
Affiliation:
University of Texas,Austin
SK Banerjee
Affiliation:
University of Texas,Austin
G Lian
Affiliation:
Texas Instruments Incorporated
L Colombo
Affiliation:
Texas Instruments Incorporated
MJ Kim
Affiliation:
University of Texas,Dallas

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1216 - 1217
Copyright
Copyright © Microscopy Society of America 2009