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X-ray Mapping and Particle Searching with a Benchtop SEM

Published online by Cambridge University Press:  25 July 2016

Karl Kersten ,
Jos Maas ,
Jeroen Smulders  and
Ken Mason
Karl Kersten
Affiliation:
Phenom-World BV, Eindhoven – Netherlands
Jos Maas
Affiliation:
Phenom-World BV, Eindhoven – Netherlands
Jeroen Smulders
Affiliation:
Phenom-World BV, Eindhoven – Netherlands
Ken Mason
Affiliation:
Eastern Analytical, Stavelot, Belgium

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 120 - 121
Copyright
© Microscopy Society of America 2016 

References

[1] Wuhrer, R. & Mason, K. “Gunshot Residue Analysis and Particle Searching with a Benchtop SEM”, ACMM24 Melbourne Austral Feb 2016.Google Scholar