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Spatial Resolution Limits for X-ray Microanalysis of Bulk Samples

Published online by Cambridge University Press:  21 July 2003

Eric Lifshin ,
Raynald Gauvin ,
Kathleen Dunn ,
Di Wu  and
James Evertsen
Eric Lifshin
Affiliation:
University at Albany, School of NanoSciences and NanoEngineering, CESTM, 251 Fuller Rd., Albany, NY 1220
Raynald Gauvin
Affiliation:
Department of Mining, Metals and Materials Engineering, McGill University, Montreal, Quebec, Canada, H3A 2B
Kathleen Dunn
Affiliation:
University at Albany, School of NanoSciences and NanoEngineering, CESTM, 251 Fuller Rd., Albany, NY 1220
Di Wu
Affiliation:
University at Albany, School of NanoSciences and NanoEngineering, CESTM, 251 Fuller Rd., Albany, NY 1220
James Evertsen
Affiliation:
University at Albany, School of NanoSciences and NanoEngineering, CESTM, 251 Fuller Rd., Albany, NY 1220

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 536 - 537
Copyright
Copyright © Microscopy Society of America 2003