Hostname: page-component-84b7d79bbc-2l2gl Total loading time: 0 Render date: 2024-07-28T05:25:14.648Z Has data issue: false hasContentIssue false
  • English
  • Français

Silicon-standard-based Comparisons of LEAP Accuracy and Precision

Published online by Cambridge University Press:  30 July 2020

Ty Prosa
Ty Prosa*
Affiliation:
CAMECA Instruments Inc., Madison, Wisconsin, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2084 - 2085
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Thompson, K., Larson, D. J. and Ulfig, R. M., Microscopy and Microanalysis 11(S2) (2005) p. 882.Google Scholar
Shivaraman, R. et al. , Microscopy and Microanalysis 15(S2) (2009) p. 296.10.1017/S1431927609098444CrossRefGoogle Scholar
Lewis, J.B. et al. , Ultramicroscopy 159 (2015) p. 248.10.1016/j.ultramic.2015.05.021CrossRefGoogle Scholar