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A Novel Technique for Visualizing Electron Beam Induced Charging

Published online by Cambridge University Press:  24 July 2003

Xiaohu Tang  and
David C Joy
Xiaohu Tang
Affiliation:
Electron Microscope Facility, University of Tennessee, Knoxville, TN 37996-0840 USA
David C Joy
Affiliation:
Electron Microscope Facility, University of Tennessee, Knoxville, TN 37996-0840 USA Oak Ridge National Laboratory, Oak Ridge, TN 37831-6064 USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 980 - 981
Copyright
Copyright © Microscopy Society of America 2003