Hostname: page-component-76fb5796d-45l2p Total loading time: 0 Render date: 2024-04-25T09:07:05.898Z Has data issue: false hasContentIssue false
  • English
  • Français

A Newly Developed PC controlled 200kV FE-TEM

Published online by Cambridge University Press:  01 August 2003

K. Okamoto ,
Y. Ohkura ,
M. Naruse ,
K. Hasegawa ,
S. Deguchi ,
M. Kawazoe  and
M. Kersker
K. Okamoto
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo, 196-8558, Japan
Y. Ohkura
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo, 196-8558, Japan
M. Naruse
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo, 196-8558, Japan
K. Hasegawa
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo, 196-8558, Japan
S. Deguchi
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo, 196-8558, Japan
M. Kawazoe
Affiliation:
JEOL Ltd., 1-2, Musashino 3-chome, Akishima, Tokyo, 196-8558, Japan
M. Kersker
Affiliation:
JEOL USA Inc., 11 Dearborn Road, Peabody, MA 01960, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1272 - 1273
Copyright
Copyright © Microscopy Society of America 2003