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A New High Energy-resolution Soft-X-ray Spectrometer for A Transmission Electron Microscope

Published online by Cambridge University Press:  15 July 2003

M. Terauchi
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 katahira, Aoba-ku, Sendai 980-8577, JAPAN
M. Koike
Affiliation:
Advanced Photon Research Center, Kansai Research Establishment, JAERI, 8-1 Umemidai, Kizu-cho, Souraku-gun, Kyoto 619-0215, JAPAN

Abstract

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Abstract
Copyright
Copyright © Microscopy Society of America 2003