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Microstructure Characterization of Nanoscale Dielectric Layers on Niobium

Published online by Cambridge University Press:  05 September 2003

Heike Störmer  and
Dagmar Gerthsen
Heike Störmer
Affiliation:
Laboratorium für Elektronenmikroskopie, Universität Karlsruhe (TH), D-76128 Karlsruhe, Germany
Dagmar Gerthsen
Affiliation:
Laboratorium für Elektronenmikroskopie, Universität Karlsruhe (TH), D-76128 Karlsruhe, Germany
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Type
Invited Papers
Information
Microscopy and Microanalysis , Volume 9 , Issue S03 , September 2003 , pp. 238 - 239
Copyright
Copyright © Microscopy Society of America 2003

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