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Lattice parameter measurement by CBED: Accuracy limited by the noise

Published online by Cambridge University Press:  05 September 2003

Andrey Chuvilin ,
Thomas Kups  and
Ute Kaiser
Andrey Chuvilin
Affiliation:
Institute of Solid State Physics, Friedrich Schiller University Jena, Max-Wien-Platz 1, Jena D-07743, Germany
Thomas Kups
Affiliation:
Institute of Solid State Physics, Friedrich Schiller University Jena, Max-Wien-Platz 1, Jena D-07743, Germany
Ute Kaiser
Affiliation:
Institute of Solid State Physics, Friedrich Schiller University Jena, Max-Wien-Platz 1, Jena D-07743, Germany
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Abstract

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Type
Invited Papers
Information
Microscopy and Microanalysis , Volume 9 , Issue S03 , September 2003 , pp. 356 - 357
Copyright
Copyright © Microscopy Society of America 2003

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