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Combining histological and ultrastructural description of high-pressure frozen skin samples by correlative CLSM and TEM

Published online by Cambridge University Press:  04 September 2003

S.S. Biel
Affiliation:
Beiersdorf AG, Analytical Microscopy Dept., 20245 Hamburg, Germany
K. Kawaschinski
Affiliation:
Beiersdorf AG, Analytical Microscopy Dept., 20245 Hamburg, Germany
K.P. Wittern
Affiliation:
Beiersdorf AG, Analytical Microscopy Dept., 20245 Hamburg, Germany
U. Hintze
Affiliation:
Beiersdorf AG, Analytical Microscopy Dept., 20245 Hamburg, Germany
R. Wepf
Affiliation:
Beiersdorf AG, Analytical Microscopy Dept., 20245 Hamburg, Germany
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Abstract

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Type
Invited Papers
Copyright
Copyright © Microscopy Society of America 2003

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