Hostname: page-component-8448b6f56d-mp689 Total loading time: 0 Render date: 2024-04-25T05:33:07.685Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of Pipe Bomb Fragments using Optical Microscopy and Scanning Electron Microscopy

Published online by Cambridge University Press:  01 August 2010

MJ Platek ,
OJ Gregory ,
T Duarte ,
J Oxley ,
J Smith  and
E Bernier
MJ Platek
Affiliation:
University of Rhode Island
OJ Gregory
Affiliation:
University of Rhode Island
T Duarte
Affiliation:
University of Rhode Island
J Oxley
Affiliation:
University of Rhode Island
J Smith
Affiliation:
University of Rhode Island
E Bernier
Affiliation:
University of Rhode Island

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1570 - 1571
Copyright
Copyright © Microscopy Society of America 2010