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Scale transition models and X-ray stress analysis

  • M. François

Abstract

In the present paper, a synthesis of the relations between diffraction stress analysis and multiscale modelling is presented. It is found that, although models give good qualitative and quantitative results in the elastic field, the extension to internal stresses of elastic-plastic origin remains semi-quantitative and many studies are still required to obtain a consistent formulation between diffraction and modelling.

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