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Two-stage sintering of dense superconducting YBa2Cu4O8 ceramics
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- 31 January 2011, pp. 1205-1209
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Biaxial alignment control of YBa2Cu3O7−x films on random Ni-based alloy with textured yttrium stabilized-zirconia films formed by ion-beam-assisted deposition
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- 31 January 2011, pp. 2913-2923
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Unusual behavior of the magnetoresistance of boron carbonitride films at low temperature
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- 31 January 2011, pp. 1711-1721
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Phase formation and thermodynamics of unstable Cu–Cr alloys
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- 31 January 2011, pp. 1463-1467
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Low Energy Ion Impact-enhanced Growth of Cubic Boron Nitride in a Supersonic Nitrogen/argon Plasma Flow
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- 31 January 2011, pp. 2014-2026
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On the formation of solid state crystallized intrinsic polycrystalline germanium thin films
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- 31 January 2011, pp. 2548-2551
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Preparation of TiO2-based powders with high photocatalytic activities
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- 31 January 2011, pp. 607-609
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Study of fluoride induced dissimilar metal corrosion in a microelectromechanical system
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- 31 January 2011, pp. 3241-3245
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Improving the wear resistance of Al–Si alloy by ion implantation
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- 31 January 2011, pp. 3246-3249
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Single crystal growth of cuprates from hydroxide fluxes
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- 31 January 2011, pp. 1210-1213
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Chemical synthesis of a new tin dioxide based (SnO2 : Co, Al, Nb) varistor
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- 31 January 2011, pp. 326-328
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Conductors with controlled grain boundaries: An approach to the next generation, high temperature superconducting wire
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- 31 January 2011, pp. 2924-2940
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Similarities and Differences in the Microstructure of Attritor-milled Fe–Al–N Compositions
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- 31 January 2011, pp. 947-952
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Thermal cycling effects in high temperature Cu–Al–Ni–Mn–B shape memory alloys
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- 31 January 2011, pp. 2288-2297
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Quantum size effect of ZnSe microcrystal-doped SiO2 glass thin films prepared by RF-sputtering method
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- 31 January 2011, pp. 2552-2558
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Stoichiometric icosahedral phase in the Zn–Mg–Y system
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- 31 January 2011, pp. 1468-1471
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Micromechanical and tribological characterization of doped single-crystal silicon and polysilicon films for microelectromechanical systems devices
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- 31 January 2011, pp. 54-63
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Influence of Ar impurities on optical refractive index of sputter deposited a–Si films
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- 31 January 2011, pp. 1722-1726
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Evidence of critical scaling behavior during vapor phase synthesis of continuous filament composites
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- 31 January 2011, pp. 610-612
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Quantitative Analysis of Electromigration Damage in Al-based Conductor Lines
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- 31 January 2011, pp. 2027-2037
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