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Identification of a growth defect in solid C60 by electron diffraction

Published online by Cambridge University Press:  31 January 2011

D.E. Luzzi ,
J.E. Fischer ,
X.Q. Wang ,
D.A. Ricketts-Foot ,
A.R. McGhie  and
W.J. Romanow
D.E. Luzzi
Affiliation:
Department of Materials Science and Engineering and Laboratory for Research on the Structure of Matter, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
J.E. Fischer
Affiliation:
Department of Materials Science and Engineering and Laboratory for Research on the Structure of Matter, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
X.Q. Wang
Affiliation:
Laboratory for Research on the Structure of Matter, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
D.A. Ricketts-Foot
Affiliation:
Laboratory for Research on the Structure of Matter, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
A.R. McGhie
Affiliation:
Laboratory for Research on the Structure of Matter, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
W.J. Romanow
Affiliation:
Laboratory for Research on the Structure of Matter, The University of Pennsylvania, Philadelphia, Pennsylvania 19104-6272
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Abstract

The origin of an anomalous sawtooth-shaped feature in x-ray powder diffraction of solid C60 is explained via electron diffraction analysis. Films sublimed on holey carbon crystallize with close-packed (111) planes parallel to the surface. Rods of diffuse scattering are found along the 〈111〉 axis normal to the surface but not along other 〈111〉 axes. Powder averaging of these rods, coupled with the x-ray form factor of spherical shells with 3.5 Å radius, accounts for the sawtooth feature. We attribute this phenomenon to planar defects parallel to close-packed layers, which form during the growth of solid C60 by sublimation. A possibly related consequence of the growth mode is the observation of strong macroscopic (111) preferred orientation in films sublimed on a variety of substrates.

Type
Articles
Information
Journal of Materials Research , Volume 7 , Issue 2 , February 1992 , pp. 335 - 340
Copyright
Copyright © Materials Research Society 1992

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