Hostname: page-component-84b7d79bbc-g7rbq Total loading time: 0 Render date: 2024-07-29T21:43:31.617Z Has data issue: false hasContentIssue false

Deposition of Epitaxial Titanium Carbide Films on MgO(001) and 6H–SiC(0001) by Coevaporation of Ti and C60

Published online by Cambridge University Press:  31 January 2011

Lars Norin
Affiliation:
Ångström Laboratory, Department of Inorganic Chemistry, Uppsala University, P.O. Box 538, S-751 21 Uppsala, Sweden
Jun Lu
Affiliation:
Ångström Laboratory, Department of Inorganic Chemistry, Uppsala University, P.O. Box 538, S-751 21 Uppsala, Sweden
Ulf Jansson
Affiliation:
Ångström Laboratory, Department of Inorganic Chemistry, Uppsala University, P.O. Box 538, S-751 21 Uppsala, Sweden
Jan-Olle Malm
Affiliation:
National Center of HREM, Department of Inorganic Chemistry 2, Lund University, P.O. Box 124, S-221 00, Lund, Sweden
Get access

Abstract

Epitaxial films of TiC1-x (0.15 < x < 0.50) were deposited on MgO(001) and 6H–SiC(0001) at 250 and 400 °C by coevaporation of C60 and Ti. Films deposited on MgO(001) were single-crystalline down to deposition temperatures of at least 250 °C as determined by x-`ray diffraction (XRD), low energy electron diffraction (LEED), and transmission electron microscopy (TEM). Films deposited on 6H–SiC(0001) were also epitaxial at 250 °C, but TEM showed a columnar microstructure due to the occurrence of twinned domains in the [111] growth direction normal to the substrate.

Type
Articles
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Pierson, H. O., Handbook of Refractory Carbides and Nitrides: Properties, Characteristics, Processing, and Applications (Noyes Publications, Pine Ridge, NJ, 1996).Google Scholar
2.Oyama, S.T., Catalysis Today 15, 179 (1992).Google Scholar
3.Parsons, J. D., Kruaval, G. B., and Chaddha, A. K., Appl. Phys. Lett. 65, 2075 (1994).Google Scholar
4.Chaddha, A.K., Parsons, J. D., and Kruaval, G.B., Appl. Phys. Lett. 66, 760 (1995).Google Scholar
5.Yee, K.K., Int. Met. Rev. 1, 19 (1978).Google Scholar
6.He, X-M., Li, W-Z., and Li, H-D., J. Mater. Res. 9, 2355 (1994).Google Scholar
7.Arai, T., Fujita, H., and Oguri, K., Thin Solid Films 165, 139 (1988).Google Scholar
8.Kaloyeros, A., Williams, W.S., and Constant, G., Rev. Sci. Instrum. 59, 1209 (1988).Google Scholar
9.Nickl, J. J., Schweitzer, K., and Hahlweg, A., J. Less-Common Met. 51, 235 (1977).CrossRefGoogle Scholar
10.Zhao, Q., Parsons, J., Chen, H., Chaddha, A., Wu, J., Kruaval, G., and Downham, D., Mater. Res. Bull. 30, 761 (1995).Google Scholar
11.Norin, L., McGinnis, S., Jansson, U., and Carlsson, J-O., J. Vac. Sci. Technol. A 15, 3082 (1997).CrossRefGoogle Scholar
12.Johansson, L.I., Johansson, H.I. P., and Ha, K. L.?kansson, Phys. Rev. B 48, 14520 (1993).Google Scholar
13.Storms, E.K., The Refractory Metal Carbides (Academic Press, New York, 1967).Google Scholar
14.Chien, F.R., Nutt, S. R., Carulli, J.M. Jr, Buchan, N., Beetz, C. P. Jr, and Yoo, W. S., J. Mater. Res. 9, 2086 (1994).Google Scholar
15.Qian, L., Norin, L., Guo, J-H., Såthe, C., Agui, A., Jansson, U., and Nordgren, J., unpublished.Google Scholar