Turkane, SM and Kureshi, AK (2017) Emerging interconnects: a state-of-the-art review and emerging solutions. International Journal of Electronics 104, 1107–1119.
Smoliner, J, Huber, HP, Hochleitner, M, Moertelmaier, M and Kienberger, F (2010) Scanning microwave microscopy/spectroscopy on metal-oxide-semiconductor systems. Journal of Applied Physics 108, 064315-1–064315-1.
You, L, Ahn, J-J, Obeng, YS and Kopanski, JJ (2016) Subsurface imaging of metal lines embedded in a dielectric with a scanning microwave microscope. Journal of Physics D: Applied Physics 49, 045502-1–045502-11.
Jin, X, Xiong, K, Marstell, R, Strandwitz, N, Hwang, JCM, Farina, M, Göritz, A, Wietstruck, M and Kaynak, M (2017) Scanning microwave microscopy of aluminum CMOS interconnect lines buried in oxide and water, European Microwave Conference (EUMC), Nuremberg, Germany.
Mai, A and Kaynak, M (2016) SiGe-BiCMOS based technology platforms for mm-wave and radar applications, International Conference on Microwave, Radar and Wireless Communications (MIKON), Krakow, Poland.
Ellison, W (2007) Permittivity of pure water, at standard atmospheric pressure, over the frequency range 0–25 THz and the temperature range 0–100 °C. Journal of Physical and Chemical Reference Data 36, 1–18.
Lai, K, Kundhikanjana, W, Kelly, MA and Shen, ZX (2008) Calibration of shielded microwave probes using bulk dielectrics. Applied Physics Letters 93, 123105-1–123105-3.
Tuca, S-S, Gramse, G, Kasper, M, Brinciotti, E, Oh, Y-J, Campagnaro, GM, Badino, G, Hinterdorfer, P and Kienberger, F (2015) Single E-coli bacteria imaged at 20 GHz frequency using the scanning microwave microscope (SMM). Microscopy and Analysis 29(4), 9–12.