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High Angular Resolution with Rotation Shearing Interferometers: Preliminary Results and Future Potentials

Published online by Cambridge University Press:  12 April 2016

F. Roddier  and
C. Roddier
F. Roddier
Affiliation:
Université de Nice – Département d'Astrophysique de l'I.M.S.P.E.R.A. 669 du C.N.R.S. – Pare Valrose F-06034 NICE CEDEX
C. Roddier
Affiliation:
Université de Nice – Département d'Astrophysique de l'I.M.S.P.E.R.A. 669 du C.N.R.S. – Pare Valrose F-06034 NICE CEDEX

Extract

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Compared to speckle-interferometry, amplitude-interferometry has the following advantages:

  1. (1) The amplitude of the object Fourier components is insensitive to both turbulence and telescope induced aberrations, permitting an accurate calibration of visibility curves,

  2. (2) Interferograms are free from speckle noise, permitting a better signal-to-noise ratio on bright sources,

  3. (3) Information can be retrieved from fewer exposures (including complete image reconstruction),

  4. (4) Accurate visual measurements of stellar diameters and of the angular spacing of binary stars can be easily performed.

Type
Session III: Interferometry
Information
International Astronomical Union Colloquium , Volume 67: Instrumentation for Astronomy with Large Optical Telescopes , 1982 , pp. 207 - 211
Copyright
Copyright © Reidel 1982

References

Foy, R. (personal communication)Google Scholar
Ricort, G., Aime, C., Vernin, J. and Kadiri, S. 1981, To appear in Astron. Astrophys.Google Scholar
Roddier, F., Roddier, C. and Demarcq, J. 1978, J. Optics (Paris) 9, p. 145.CrossRefGoogle Scholar
Roddier, C. and Roddier, F. 1979, Formation of Images from Spatial Coherence Functions in Astronomy (IAU Colloquium No. 49), ed. Van Schooneveld, C., D. Reidei Pubi. Co., pp. 175–185.CrossRefGoogle Scholar
Roddier, F. 1979, High Angular Resolution Stellar-Interferometry (IAU Colloquium No. 50), ed. Davis, J. and Tango, W.J., Chatterton Astron. Dept., Univ. of Sydney, pp. 32/1–15.Google Scholar
Roddier, C., Roddier, F., Martin, F., Baranne, A. and Brun, R. 1980, J. Optics (Paris), 11, p. 149.CrossRefGoogle Scholar