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18 - Emission and Breakdown Phenomena

Published online by Cambridge University Press:  27 April 2018

Richard G. Carter
Affiliation:
Lancaster University
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Summary

Fast-wave devices employ interactions between modes of propagation in a smooth waveguide whose phase velocity is greater than the velocity of light and electron beams which are periodic so that synchronous interaction is possible. The most important type of tube is the gyrotron (electron cyclotron maser) in which the electrons moving in orbits under the influence of a longitudinal magnetic field interact with a transverse electric (TE) waveguide mode. The small-signal theory of gyrotrons reveals the synchronous conditions for the gyrotron oscillator, the gyro-klystron, -TWT and -BWO and the cyclotron auto-resonance maser (CARM). A simple non-linear model is described which can reproduce the main features of the performance of a gyrotron oscillator. The principles of the design of gyrotron oscillators and amplifiers are reviewed. There is a brief discussion of the principles of operation of the peniotron and the ubitron (free electron laser).
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Publisher: Cambridge University Press
Print publication year: 2018

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References

Dekker, A. J., Solid State Physics. London: Macmillan, 1963.Google Scholar
Gaertner, G. and Koops, W. W. P., ‘Vacuum electron sources and their materials and technologies’, in Eichmeier, J. A. and Thumm, M. K., eds, Vacuum Electronics: Components and Devices. Berlin: Springer, pp. 429481, 2008.CrossRefGoogle Scholar
Kaye, G. W. C. and Laby, T. H. Tables of Physical and Chemical Constants. Available at: www.kayelaby.npl.co.uk/ (accessed 5 October 2017), 2014.Google Scholar
Sharma, A. et al., ‘Emission poisoning studies on impregnated tungsten dispenser cathode under CO2 and O2 environment’, Applied Surface Science, vol. 40, pp. 97101, 1989.CrossRefGoogle Scholar
Kohl, W. H., Handbook of Materials and Techniques for Vacuum Devices. New York: American Institute of Physics, 1995.Google Scholar
Cronin, J. L., ‘Modern dispenser cathodes’, IEE Proceedings I: Solid-State and Electron Devices, vol. 128, pp. 1932, 1981.Google Scholar
Fowler, R. H. and Nordheim, L., ‘Electron emission in intense electric fields’, Proceedings of the Royal Society of London. Series A, Containing Papers of a Mathematical and Physical Character, vol. 119, pp. 173181, 1928.Google Scholar
Brodie, I. and Schwoebel, P. R., ‘Vacuum microelectronic devices’, Proceedings of the IEEE, vol. 82, pp. 10061034, 1994.CrossRefGoogle Scholar
Jordan, N. M. et al., ‘Electric field and electron orbits near a triple point’, Journal of Applied Physics, vol. 102, p. 033301, 2007.CrossRefGoogle Scholar
Eichmeier, J. A., ‘Radiation sensitive vacuum electronic components and devices’, in Eichmeier, J. A. and Thumm, M., eds, Vacuum Electronics: Components and Devices. Berlin: Springer, pp. 127154, 2008.CrossRefGoogle Scholar
Gewartowski, J. W. and Watson, H. A., Principles of Electron Tubes. Princeton, NJ: D. van Nostrand, 1965.Google Scholar
Nation, J. A. et al., ‘Advances in cold cathode physics and technology’, Proceedings of the IEEE, vol. 87, pp. 865889, 1999.CrossRefGoogle Scholar
Umstattd, R. J., ‘Advanced electron-beam sources’, in Barker, R. J. et al., eds, Modern Microwave and Millimetre-Wave Power Electronics. Piscataway, NJ: IEEE Press, pp. 393443, 2005.Google Scholar
Sternglass, E., ‘Theory of secondary electron emission by high-speed ions’, Physical Review, vol. 108, pp. 112, 1957.CrossRefGoogle Scholar
Scholtz, J. J. et al., ‘Secondary electron emission properties’, Philips Journal of Research, vol. 50, pp. 375389, 1996.CrossRefGoogle Scholar
Rudberg, E., ‘Inelastic scattering of electrons from solids’, Physical Review, vol. 50, pp. 138150, 1936.CrossRefGoogle Scholar
Shih, A. et al., ‘Secondary electron emission properties of oxidized beryllium CFA cathodes’, IEEE Transactions on Electron Devices, vol. 41, pp. 24482454, 1994.CrossRefGoogle Scholar
Furman, M. A. and Pivi, M. T. F., ‘Probabilistic model for the simulation of secondary electron emission’, Physical Review Special Topics – Accelerators and Beams, vol. 5, p. 124404, 2002.CrossRefGoogle Scholar
Chernin, D. et al., ‘A model of secondary emission for use in computer simulation of vacuum electronic devices’, in International Electron Devices Meeting, pp. 773776, 1993.CrossRefGoogle Scholar
Seiler, H., ‘Secondary electron emission in the scanning electron microscope’, Journal of Applied Physics, vol. 54, pp. R1–R18, 1983.CrossRefGoogle Scholar
Baglin, V. et al., ‘A summary of main experimental results concerning the secondary electron emission of copper’, CERN, Geneva, 2001.Google Scholar
Henrist, B. et al., ‘Secondary electron emission data for the simulation of electron cloud’, in Proc. Mini Workshop on Electron Cloud Simulations for Proton and Positron Beams (ECLOUD’02), pp. 7578, 2002.Google Scholar
Lin, Y. and Joy, D. C., ‘A new examination of secondary electron yield data’, Surface and Interface Analysis, vol. 37, pp. 895900, 2005.CrossRefGoogle Scholar
Tolias, P., ‘On secondary electron emission and its semi-empirical description’, Plasma Physics and Controlled Fusion, vol. 56, p. 123002, 2014.CrossRefGoogle Scholar
Baglin, V. et al., ‘The secondary electron yield of technical materials and its variation with surface treatments’, in EPAC 2000, Vienna, Austria, pp. 217221, 2000.Google Scholar
Walker, C. et al., ‘The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250–5000 eV: a theory/experiment comparison’, Scanning, vol. 30, pp. 365380, 2008.CrossRefGoogle ScholarPubMed
Walker, C. et al., ‘The secondary electron emission yield for 24 solid elements excited by primary electrons in the range 250–5000 eV: a theory/experiment comparison’, Scanning, vol. 30, pp. 365380, 2008.CrossRefGoogle ScholarPubMed
Kanaya, K. et al., ‘Secondary electron emission from insulators’, Journal of Physics D: Applied Physics, vol. 11, p. 2425, 1978.CrossRefGoogle Scholar
Dallos, A. et al., ‘Effects of ionized oxygen on primary and secondary emission, and total current of a CFA’, IEEE Transactions on Electron Devices, vol. 34, pp. 12011208, 1987.CrossRefGoogle Scholar
Lorkiewicz, J. et al., ‘Surface TiN coating of TESLA couplers at DESY as an antimultipactor remedy’, in The 10th Workshop on RF Superconductivity, 2001.Google Scholar
Michizono, S. et al., ‘Secondary electron emission of sapphire and anti-multipactor coatings at high temperature’, Applied Surface Science, vol. 235, pp. 227230, 2004.CrossRefGoogle Scholar
Fuentes, G. et al., ‘Spectroscopic investigations of Cr, CrN and TiCr anti-multipactor coatings grown by cathodic-arc reactive evaporation’, Applied Surface Science, vol. 253, pp. 76277631, 2007.CrossRefGoogle Scholar
Pivi, M. et al., ‘Sharp reduction of the secondary electron emission yield from grooved surfaces’, Journal of Applied Physics, vol. 104, p. 104904, 2008.CrossRefGoogle Scholar
Curren, A. N. and Jensen, K. A., ‘Secondary electron emission characteristics of ion-textured copper and high-purity isotropic graphite surfaces’, NASA Lewis Research Center, Cleveland OH, July 1984.Google Scholar
Ye, M. et al., ‘Suppression of secondary electron yield by micro-porous array structure’, Journal of Applied Physics, vol. 113, p. 074904, 2013.CrossRefGoogle Scholar
Nistor, V. et al., ‘Multipactor suppression by micro-structured gold/silver coatings for space applications’, Applied Surface Science, vol. 315, pp. 445453, 2014.CrossRefGoogle Scholar
Xie, A.-G. et al., ‘Maximum secondary electron yield and parameters of secondary electron yield of metals’, Surface Review and Letters, vol. 23, p. 1650039, 2016.CrossRefGoogle Scholar
Agarwal, B. K., ‘Variation of secondary emission with primary electron energy’, Proceedings of the Physical Society, vol. 71, p. 851, 1958.CrossRefGoogle Scholar
Vaughan, J. R. M., ‘A new formula for secondary emission yield’, IEEE Transactions on Electron Devices, vol. 36, pp. 19631967, 1989.CrossRefGoogle Scholar
Dionne, G. F., ‘Effects of secondary electron scattering on secondary emission yield curves’, Journal of Applied Physics, vol. 44, pp. 53615364, 1973.CrossRefGoogle Scholar
Dionne, G. F., ‘Origin of secondary-electron-emission yield-curve parameters’, Journal of Applied Physics, vol. 46, pp. 33473351, 1975.CrossRefGoogle Scholar
Salehi, M. and Flinn, E., ‘An experimental assessment of proposed universal yield curves for secondary electron emission’, Journal of Physics D: Applied Physics, vol. 13, p. 281, 1980.CrossRefGoogle Scholar
Insepov, Z. et al., ‘Comparison of candidate secondary electron emission materials’, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 268, pp. 33153320, 2010.CrossRefGoogle Scholar
Vaughan, R., ‘Secondary emission formulas’, IEEE Transactions on Electron Devices, vol. 40, p. 830, 1993.CrossRefGoogle Scholar
Shih, A. and Hor, C., ‘Secondary emission properties as a function of the electron incidence angle’, IEEE Transactions on Electron Devices, vol. 40, pp. 824829, 1993.CrossRefGoogle Scholar
Yu, S. et al., ‘Secondary electron emission for layered structures’, Journal of Vacuum Science & Technology A, vol. 20, pp. 950952, 2002.CrossRefGoogle Scholar
Kitchen, R., RF and Microwave Radiation Safety Handbook. Newnes, 2001.Google Scholar
AMPTEK Inc., Mini-X X-Ray Tube System for XRF, Available at: http://amptek.com/products/mini-x-ray-tube/#5 (accessed 5 October 2017), 25 July 2017.Google Scholar
Hubbell, J. H. and Seltzer, S. M., Tables of X-Ray Mass Attenuation Coefficients and Mass Energy-Absorption Coefficients (version 1.4), 2 March. Available at: http://physics.nist.gov/xaamdi (accessed 5 October 2017), 2004.Google Scholar
Shultis, J. K. and Faw, R. E., ‘Radiation shielding technology’, Health Physics, vol. 88, pp. 587612, 2005.CrossRefGoogle ScholarPubMed
Forman, R., ‘Update of thermionic cathode progress’, in International Electron Devices Meeting, pp. 387390, 1991.Google Scholar
Hasker, J. et al., ‘Properties and manufacture of top-layer scandate cathodes’, Applied Surface Science, vol. 26, pp. 173195, 1986.CrossRefGoogle Scholar
Gaertner, G. and Barratt, D., ‘Life-limiting mechanisms in Ba-oxide, Ba-dispenser and Ba-Scandate cathodes’, in The 5th International Vacuum Electron Sources Conference, pp. 5961, 2004.Google Scholar
Tuck, R., ‘Thermionic cathode surfaces: the state-of-the-art and outstanding problems’, Vacuum, vol. 33, pp. 715721, 1983.CrossRefGoogle Scholar
Falce, L. R., ‘Dispenser cathodes: The current state of the technology’, in International Electron Devices Meeting, pp. 448451, 1983.Google Scholar
Shroff, A., ‘Review of dispenser cathodes’, Revue technique-Thomson-CSF, vol. 23, pp. 9471026, 1991.Google Scholar
Harbaugh, W. E., ‘Tungsten, thoriated tungsten and thoria emitters’, in Electron Tube Design. Harrison, NJ: Radio Corporation of America, pp. 9098, 1962.Google Scholar
Yingst, T. E. et al., ‘High-power gridded tubes -1972’, Proceedings of the IEEE, vol. 61, pp. 357381, 1973.CrossRefGoogle Scholar
Zhang, M. et al., ‘Influence of plasma spraying on the performance of oxide cathodes’, IEEE Transactions on Electron Devices, vol. 58, pp. 21432148, 2011.CrossRefGoogle Scholar
Longo, R. T. et al., ‘Dispenser cathode life prediction model’, in International Electron Devices Meeting, pp. 318321, 1984.Google Scholar
Longo, R., ‘Physics of thermionic dispenser cathode aging’, Journal of Applied Physics, vol. 94, pp. 69666975, 2003.CrossRefGoogle Scholar
Raju, R. S., ‘Studies on W-Re mixed-matrix cathodes’, IEEE Transactions on Electron Devices, vol. 56, pp. 786793, 2009.CrossRefGoogle Scholar
Spindt, C. A. et al., ‘Field-emitter arrays for vacuum microelectronics’, IEEE Transactions on Electron Devices, vol. 38, pp. 23552363, 1991.CrossRefGoogle Scholar
Spindt, C., ‘A brief history vacuum nanoelectronics, the IVNC, and the present status of the Spindt cathode’, in 25th International Vacuum Nanoelectronics Conference, pp. 12, 2012.Google Scholar
Whaley, D. R. et al., ‘Application of field emitter arrays to microwave power amplifiers’, IEEE Transactions on Plasma Science, vol. 28, pp. 727747, 2000.Google Scholar
Whaley, D. R. et al., ‘Experimental demonstration of an emission-gated traveling-wave tube amplifier’, IEEE Transactions on Plasma Science, vol. 30, pp. 9981008, 2002.CrossRefGoogle Scholar
Whaley, D. R. et al., ‘100 W operation of a cold cathode TWT’, IEEE Transactions on Electron Devices, vol. 56, pp. 896905, 2009.CrossRefGoogle Scholar
Whaley, D. et al., ‘High average power field emitter cathode and testbed for X/Ku-band cold cathode TWT’, in IEEE International Vacuum Electronics Conference (IVEC), pp. 12, 2013.Google Scholar
Spindt, C. et al., ‘11.1: A reliable improved Spindt cathode design for high currents’, in IEEE International Vacuum Electronics Conference (IVEC), pp. 201202, 2010.CrossRefGoogle Scholar
Kilpatrick, W. D., ‘Criterion for vacuum sparking designed to include both RF and DC’, Rev. Sci. Instrum., vol. 28, pp. 824826, 1957.CrossRefGoogle Scholar
Peter, W. et al., ‘Criteria for vacuum breakdown in RF cavities’, IEEE Transactions on Nuclear Science, vol. 30, pp. 34543456, 1983.CrossRefGoogle Scholar
Gilmour, A. S., Jr., Microwave Tubes. Dedham, MA: Artech House, 1986.Google Scholar
Faillon, G., ‘Technical and industrial overview of RF and microwave tubes for fusion’, Fusion Engineering and Design, vol. 46, pp. 371381, 1999.CrossRefGoogle Scholar
Döbert, S., ‘Gradient limitations for high-frequency accelerators’, presented at the LINAC 2004, Lübeck, Germany, 2004.CrossRefGoogle Scholar
Braun, H. H. et al., ‘Frequency and temperature dependence of electrical breakdown at 21, 30, and 39 GHz’, Physical Review Letters, vol. 90, p. 224801, 2003.CrossRefGoogle ScholarPubMed
Farrall, G. A., ‘Vacuum arcs and switching’, Proceedings of the IEEE, vol. 61, pp. 11131136, 1973.CrossRefGoogle Scholar
Beilis, I. I., ‘State of the theory of vacuum arcs’, IEEE Transactions on Plasma Science, vol. 29, pp. 657670, 2001.CrossRefGoogle Scholar
Cobine, J. D., Gaseous Conductors. New York: Dover, 1941.Google Scholar
Denholm, A. S., ‘High voltage technology’, IEEE Transactions on Nuclear Science, vol. 12, pp. 780791, June 1965.CrossRefGoogle Scholar
Xiao, D., ‘Fundamental Theory of Townsend Discharge’, in Gas Discharge and Gas Insulation. Shanghai: Shanghai Jiao Tong University Press, pp. 4788, 2016.CrossRefGoogle Scholar
Townsend, J., Electrons in Gases. London; New York: Hutchinson’s Scientific and Technical Publications, 1948.Google Scholar
Husain, E. and Nema, R. S., ‘Analysis of Paschen curves for air, N2 and SF6 using the Townsend breakdown equation’, IEEE Transactions on Electrical Insulation, vol. EI-17, pp. 350353, 1982.CrossRefGoogle Scholar
Kuffel, J. et al., High Voltage Engineering Fundamentals. Amsterdam: Newnes, 2000.Google Scholar
Arora, R. and Mosch, W., High Voltage and Electrical Insulation Engineering, vol. 69. John Wiley & Sons, 2011.CrossRefGoogle Scholar
Miller, H. C., ‘Surface flashover of insulators’, IEEE Transactions on Electrical Insulation, vol. 24, pp. 765786, 1989.CrossRefGoogle Scholar
Vaughan, J. R. M., ‘Multipactor’, IEEE Transactions on Electron Devices, vol. 35, pp. 11721180, 1988.CrossRefGoogle Scholar
Kishek, R. et al., ‘Multipactor discharge on metals and dielectrics: historical review and recent theories’, Physics of Plasmas (1994 – present), vol. 5, pp. 21202126, 1998.CrossRefGoogle Scholar
Riyopoulos, S., ‘Multipactor saturation due to space-charge-induced debunching’, Physics of Plasmas (1994–present), vol. 4, pp. 14481462, 1997.CrossRefGoogle Scholar
Hill, C. and Carter, R. G., ‘Investigation of possible multipactor discharge in a klystron input cavity’, in 2006 IEEE International Vacuum Electronics Conference Held Jointly with 2006 IEEE International Vacuum Electron Sources, Monterey, CA, pp. 8182, 2006.CrossRefGoogle Scholar
Vaughan, J. R. M., ‘Observations of multipactor in magnetrons’, IEEE Transactions on Electron Devices, vol. 15, pp. 883889, 1968.CrossRefGoogle Scholar
Geng, R. L. et al., ‘Suppression of multipacting in rectangular coupler waveguides’, Nuclear Instruments & Methods in Physics Research Section A: Accelerators Spectrometers Detectors and Associated Equipment, vol. 508, pp. 227238, 11 August 2003.CrossRefGoogle Scholar
Geng, R. L. et al., ‘Dynamical aspects of multipacting induced discharge in a rectangular waveguide’, Nuclear Instruments & Methods in Physics Research Section A: Accelerators Spectrometers Detectors and Associated Equipment, vol. 538, pp. 189205, 11 February 2005.CrossRefGoogle Scholar
Ylä-Oijala, P., ‘Analysis of electron multipacting in coaxial lines with traveling and mixed waves’, Deutsche Elektronen-Synchrotron DESY, MHF-SL Group, 1997.Google Scholar
Somersalo, E. et al., ‘Analysis of multipacting in coaxial lines’, in Proceedings of the 1995 Particle Accelerator Conference, pp. 15001502, 1995.CrossRefGoogle Scholar
Vaughan, J. R. M., ‘Some high-power window failures’, IRE Transactions on Electron Devices, vol. 8, pp. 302308, 1961.CrossRefGoogle Scholar
Yamaguchi, S. et al., ‘Trajectory simulation of multipactoring electrons in an S-band pillbox RF window’, IEEE Transactions on Nuclear Science, vol. 39, pp. 278282, 1992.CrossRefGoogle Scholar
Woode, A. and Petit, J., ‘Investigations into multipactor breakdown in satellite microwave payloads’, ESA Journal, vol. 14, pp. 467478, 1990.Google Scholar
Chang, C. et al., ‘Review of recent theories and experiments for improving high-power microwave window breakdown thresholds’, Physics of Plasmas, vol. 18, p. 055702, 2011.CrossRefGoogle Scholar
Shemelin, V., ‘Generalized phase stability in multipacting’, Physical Review Special Topics-Accelerators and Beams, vol. 14, p. 092002, 2011.CrossRefGoogle Scholar
Hatch, A. J. and Williams, H. B., ‘The secondary electron resonance mechanism of low-pressure high-frequency gas breakdown’, Journal of Applied Physics, vol. 25, pp. 417423, 1954.CrossRefGoogle Scholar
Hatch, A. J. and Williams, H. B., ‘Multipacting modes of high-frequency gaseous breakdown’, Physical Review, vol. 112, pp. 681685, 1958.CrossRefGoogle Scholar
Riyopoulos, S. et al., ‘Effect of random secondary delay times and emission velocities in electron multipactors’, IEEE Transactions on Electron Devices, vol. 44, pp. 489497, 1997.CrossRefGoogle Scholar
Dexter, A. and Seviour, R., ‘Rapid generation of multipactor charts by numerical solution of the phase equation’, Journal of Physics D: Applied Physics, vol. 38, p. 1383, 2005.CrossRefGoogle Scholar
Seviour, R., ‘The role of elastic and inelastic electron reflection in multipactor discharges’, IEEE Transactions on Electron Devices, vol. 52, pp. 19271930, 2005.CrossRefGoogle Scholar
Riyopoulos, S., ‘Higher-order, asymmetric orbit multipactors’, Physics of Plasmas (1994–present), vol. 14, p. 112101, 2007.CrossRefGoogle Scholar
Semenov, V. E. et al., ‘Importance of reflection of low-energy electrons on multipactor susceptibility diagrams for narrow gaps’, IEEE Transactions on Plasma Science, vol. 37, pp. 17741781, 2009.CrossRefGoogle Scholar
Proch, D. et al., ‘Measurement of multipacting currents of metal surfaces in RF fields’, in Proceedings of the 1995 Particle Accelerator Conference, pp. 17761778, 1995.CrossRefGoogle Scholar
Semenov, V. et al., ‘Multipactor in rectangular waveguides’, Physics of Plasmas (1994–present), vol. 14, p. 033501, 2007.CrossRefGoogle Scholar
Woo, R., ‘Multipacting discharges between coaxial electrodes’, Journal of Applied Physics, vol. 39, pp. 15281533, 1968.CrossRefGoogle Scholar
Udiljak, R. et al., ‘Multipactor in a coaxial transmission line. I. Analytical study’, Physics of Plasmas (1994–present), vol. 14, p. 033508, 2007.CrossRefGoogle Scholar
Riyopoulos, S. et al., ‘Theory of electron multipactor in crossed fields’, Physics of Plasmas (1994–present), vol. 2, pp. 31943213, 1995.CrossRefGoogle Scholar
Semenov, V. et al., ‘Multipactor in a coaxial transmission line. II. Particle-in-cell simulations’, Physics of Plasmas (1994–present), vol. 14, p. 033509, 2007.CrossRefGoogle Scholar
Burt, G. et al., ‘Benchmarking simulations of multipactor in rectangular waveguides using CST-particle studio’, in SRF 2009, Berlin, pp. 321–325, 2009.Google Scholar
Lingwood, C. et al., ‘Phase space analysis of multipactor saturation in rectangular waveguide’, Physics of Plasmas (1994–present), vol. 19, p. 032106, 2012.CrossRefGoogle Scholar
You, J. W. et al., ‘Highly efficient and adaptive numerical scheme to analyze multipactor in waveguide devices’, IEEE Transactions on Electron Devices, vol. 62, pp. 13271333, 2015.Google Scholar

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