Book contents
- Measurement Techniques for Radio Frequency Nanoelectronics
- The Cambridge RF and Microwave Engineering Series
- Reviews
- Measurement Techniques for Radio Frequency Nanoelectronics
- Copyright page
- Contents
- Acknowledgments
- Abbreviations
- 1 An Introduction to Radio Frequency Nanoelectronics
- 2 Core Concepts of Microwave and RF Measurements
- 3 Extreme Impedance Measurements
- 4 On-Wafer Measurements of RF Nanoelectronic Devices
- 5 Modeling and Validation of RF Nanoelectronic Devices
- 6 Characterization of Nanofiber Devices
- 7 Instrumentation for Near-Field Scanning Microwave Microscopy
- 8 Probe-Based Measurement Systems
- 9 Radio Frequency Scanning Probe Measurements of Materials
- 10 Measurement of Active Nanoelectronic Devices
- 11 Dopant Profiling in Semiconductor Nanoelectronics
- 12 Depth Profiling
- 13 Dynamics of Nanoscale Magnetic Systems
- 14 Nanoscale Electromagnetic Measurements for Life Science Applications
- Index
- References
4 - On-Wafer Measurements of RF Nanoelectronic Devices
Published online by Cambridge University Press: 21 September 2017
Book contents
- Measurement Techniques for Radio Frequency Nanoelectronics
- The Cambridge RF and Microwave Engineering Series
- Reviews
- Measurement Techniques for Radio Frequency Nanoelectronics
- Copyright page
- Contents
- Acknowledgments
- Abbreviations
- 1 An Introduction to Radio Frequency Nanoelectronics
- 2 Core Concepts of Microwave and RF Measurements
- 3 Extreme Impedance Measurements
- 4 On-Wafer Measurements of RF Nanoelectronic Devices
- 5 Modeling and Validation of RF Nanoelectronic Devices
- 6 Characterization of Nanofiber Devices
- 7 Instrumentation for Near-Field Scanning Microwave Microscopy
- 8 Probe-Based Measurement Systems
- 9 Radio Frequency Scanning Probe Measurements of Materials
- 10 Measurement of Active Nanoelectronic Devices
- 11 Dopant Profiling in Semiconductor Nanoelectronics
- 12 Depth Profiling
- 13 Dynamics of Nanoscale Magnetic Systems
- 14 Nanoscale Electromagnetic Measurements for Life Science Applications
- Index
- References
Summary
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- Publisher: Cambridge University PressPrint publication year: 2017
References
Fraser, A., Gleason, R., and Strid, E. W., “GHz On-Silicon-Wafer Probing Calibration Methods,” Proceedings of the 1988 Bipolar Circuits and Technology Meeting (1988) pp. 154–157.CrossRefGoogle Scholar
Marks, R. B. and Williams, D. F., “A General Waveguide Circuit Theory,” Journal of Research of the National Institute of Standards and Technology 97 (1992) pp. 533–562.Google Scholar
Williams, D. F., Arz, U., and Grabinski, H., “Characteristic-Impedance Measurement Error on Lossy Substrates,” IEEE Microwave and Wireless Components Letters 11 (2001) pp. 299–301.Google Scholar
Nougaret, L., Dambrine, G., Lepillett, S., Happy, H., Chimot, N., Derycke, V., and Bourgoin, J.-P., “Gigahertz Characterization of a Single Carbon Nanotube,” Applied Physics Letters 96 (2010) art. no. 042109.CrossRefGoogle Scholar
Happy, H., Haddadi, K., Theron, D., Lasri, T., and Dambrine, G., “Measurement Techniques for RF Nanoelectronic Devices,” IEEE Microwave Magazine 15 (2014) pp. 30–39.Google Scholar
Koolen, M. C. A. M., Geelen, J. A. M., and Versleijen, M. P. J. G., “An Improved De-embedding Technique for On-Wafer High-Frequency Characterization,” in Proceedings of the IEEE 1991 Bipolar Circuits and Technology Meeting (1991) pp. 188–191.Google Scholar
Marks, R. B., “A Multiline Method of Network Analyzer Calibration,” IEEE Transactions on Microwave Theory and Techniques 39 (1991) pp. 1205–1215.Google Scholar
Wen, C. P., “Coplanar Waveguide: A Surface Strip Transmission Line Suitable for Nonreciprocal Gyromagnetic Device Applications,” IEEE Transactions on Microwave Theory and Techniques 17 (1969) pp. 1087–1090.Google Scholar
Wallis, T. M., Kim, K., Filipovic, D. S., and Kabos, P., “Nanofibers for RF and Beyond,” IEEE Microwave Magazine 12 (2011) pp. 51–61.Google Scholar
Rutherglen, C. and Burke, P. J., “Nanoelectromagnetics: Circuit and Electromagnetic Properties of Carbon Nanotubes,” Small 5 (2009) pp. 884–906.Google Scholar
Li, S., Yu, Z., Yen, S.-F., Tang, W. C., and Burke, P. J., “Carbon Nanotube Transistor Operation at 2.6 GHz,” Nano Letters 4 (2004) pp. 753–756.CrossRefGoogle Scholar
Bethoux, J. M., Happy, H., Dambrine, G., Derycke, V., Goffman, M., and Burgoin, J. P., “An 8-GHz ft Carbon Nanotube Field-Effect Transistor for Gigahertz Range Applications,” IEEE Electron Device Letters 27 (2006) pp. 681–683.Google Scholar
Zhang, M., Huo, X., Chan, P. C. H., Liang, Q., and Tang, Z. K., “Radio-Frequency Characterization for the Single-Walled Carbon Nanotubes,” Applied Physics Letters 88 (2006) art. no. 163109.CrossRefGoogle Scholar
Plombon, J. J., O’Brien, K. P., Gstrein, F., Dubin, V. M., and Jiao, Y., “High Frequency Electrical Properties of Individual and Bundled Carbon Nanotubes,” Applied Physics Letters 90 (2007) art. no. 063106.Google Scholar
Vandenbrouck, S., Madjour, K., Theon, D., Dong, Y., Li, Y., Lieber, C. M., and Gaquiere, C., “12 GHz FMAX GaN/AlN/AlGaN Nanowire MISFET,” IEEE Electron Device Letters 30 (2009) pp. 322–324.Google Scholar
Rice, P., Wallis, T. M., Russek, S. E., and Kabos, P., “Broadband Electrical Characterization of Multiwalled Carbon Nanotubes and Contacts,” Nano Letters 7 (2007) pp. 1086–1090.Google Scholar
Rutherglen, C., Jain, D., and Burke, P., “RF Resistance and Inductance of Massively Parallel Single Walled Carbon Nanotubes: Direct, Broadband Measurements and Near Perfect 50 Ω Impedance Matching,” Applied Physics Letters 93 (2008) art. no. 083119.Google Scholar
Hong, S. W., Banks, T., and Rogers, J. A., “Improved Density in Aligned Arrays of Single-Walled Carbon Nanotubes by Sequential Chemical Vapor Deposition on Quartz,” Advanced Materials 22 (2010) pp. 1826–1830.Google Scholar