Part III - Selected Topics on Physics of Transduction
Published online by Cambridge University Press: 23 December 2021
Summary
A summary is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
- Type
- Chapter
- Information
- Electronic Sensor Design Principles , pp. 423 - 594Publisher: Cambridge University PressPrint publication year: 2022
References
Further Reading
Barbe, D. F., Imaging devices using the charge-coupled concept, Proc. IEEE, vol. 63, no. 1, pp. 38–67, 1975.Google Scholar
Fossum, E. R., Active pixel sensors – are CCD dinosaurs?, Proc. SPIE, vol. 1900, pp. 2–14, 1993.Google Scholar
Mendis, S. K., Kemeny, S. E., and Fossum, E. R., A 128×128 CMOS active pixel image sensor for highly integrated imaging systems.” In Proceedings of the IEEE International Electron Devices Meeting, pp. 583–586, 1993.Google Scholar
Sze, S. M., and Ng, K. K., Physics of Semiconductor Devices. Hoboken, NJ: Wiley-Interscience, 2007.Google Scholar
Yadid-Pecht, O., Ginosar, R., and Shacham-Diamand, Y., A random access photodiode array for intelligent image capture, IEEE Trans. Electron Devices, vol. 38, no. 8, pp. 1772–1780, 1991.Google Scholar
Further Reading
Bard, A. J., and Faulkner, L. R., Electrochemical Methods Fundamentals and Applications. Hoboken, NJ: John Wiley & Sons, 2001.Google Scholar
Barsoukov, E. and Macdonald, J. R., Impedance Spectroscopy: Theory, Experiment, and Applications, 2nd ed. Hoboken, NJ: John Wiley & Sons, 2005.CrossRefGoogle Scholar
Chi, Y. M., Jung, T., and Cauwenberghs, G., Dry-contact and noncontact biopotential electrodes: Methodological review. IEEE Rev. Biomed. Eng., vol. 3, pp. 106–119, 2010.CrossRefGoogle ScholarPubMed
Crescentini, M., Bennati, M., Carminati, M., and Tartagni, M., Noise limits of CMOS current interfaces for biosensors: A review. IEEE Trans. Biomed. Circuits Syst., vol. 8, no. 2, pp. 278–292, April 2014.CrossRefGoogle ScholarPubMed
Feynman, R. P., Robert, B. L., Sands, M., and Gottlieb, M. A., The Feynman Lectures on Physics. Reading, MA: Pearson/Addison-Wesley, 1963.Google Scholar
Haus, A. H. and Melcher, J. R., Electromagnetic Fields and Energy. Upper Saddle River, NJ: Prentice Hall, 1989.Google Scholar
Hille, B., Ion Channels of Excitable Membranes. Sunderland, MA: Sinauer Associates, 2001.Google Scholar
Morgan, H., and Green, N. G., AC Electrokinetics: Colloids and Nanoparticles. Research Studies Press, 2003.Google Scholar
Orazem, M. E. and Tribollet, B. Electrochemical Impedance Spectroscopy. Hoboken, NJ: John Wiley & Sons, 2008.CrossRefGoogle Scholar
Webster, J. G., Clark, J. W., Neuman, M. R., Peura, R. A., Wheeler, L. A., and Olson, W. H., Medical Instrumentation, 4th ed. Hoboken, NJ: John Wiley & Sons, 2009.Google Scholar
Further Reading
Caspari, E., and Merz, W. J., The electromechanical behavior of BaTiO3 single-domain crystals, Phys. Rev., vol. 80, no. 6, pp. 1082–1089, Dec. 1950.Google Scholar
Feynman, R. P., Robert, B. L., Sands, M., and Gottlieb, M. A., The Feynman Lectures on Physics. Reading, MA: Pearson/Addison-Wesley, 1963.Google Scholar
Institute of Electrical and Electronics Engineers, 176–1987 – ANSI/IEEE Standard on Piezoelectricity, 1988.Google Scholar
Kanda, Y., A graphical representation of the piezoresistance coefficients in silicon,” IEEE Trans. Electron Devices, vol. 29, no. 1, pp. 64–70, 1982.Google Scholar
Kerr, D. R., and Milnes, A. G., Piezoresistance of diffused layers in cubic semiconductors, J. Appl. Phys., vol. 34, no. 4, pp. 727–731, 1963.Google Scholar
Madou, M., Fundamentals of Microfabrication: The Science of Miniaturization, 2nd ed. Boca Raton, FL: CRC Press, 2002.Google Scholar
Nemeth, M. P., An in-depth tutorial on constitutive equations for elastic anisotropic materials,” NASA Report NASA/TM–2011–217314, 2011.Google Scholar
Smith, C. S., Piezoresistance effect in germanium and silicon, Phys. Rev., vol. 94, no. 1, pp. 42–49, 1954.CrossRefGoogle Scholar
Vishay Precision Group, Strain gage thermal output and gage factor variation with temperature,” 2012.Google Scholar
Warren Young, A. S., and Budynas, R., Roark’s Formulas for Stress and Strain, 8th ed. New York: McGraw-Hill, 2011.Google Scholar
www.acromag.com, Criteria for temperature sensor selection of T/C and RTD Sensor types, 2011.Google Scholar