2 results
Handy waveguide TXRF spectrometer for nanogram sensitivity
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- Journal:
- Powder Diffraction / Volume 23 / Issue 2 / June 2008
- Published online by Cambridge University Press:
- 29 February 2012, pp. 146-149
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Influence of the sample morphology on total reflection X-ray fluorescence analysis
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- Journal:
- Powder Diffraction / Volume 24 / Issue 2 / June 2009
- Published online by Cambridge University Press:
- 29 February 2012, pp. 140-144
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