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Direct atomistic defect observations by depth sectioning and dynamic STEM
- Journal: Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press: 30 July 2021, pp. 2138-2139
- Print publication: August 2021
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Development of High-Speed Scan System for Atomic Resolution STEM
- Journal: Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press: 30 July 2021, pp. 2710-2712
- Print publication: August 2021
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Phase-Contrast-Based Structure Retrieval Methods in Atomic Resolution Scanning Transmission Electron Microscopy – When They Hold and When They Don't
- Journal: Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press: 30 July 2020, pp. 442-443
- Print publication: August 2020
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TV-rate Atomic-resolution STEM Imaging
- Journal: Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press: 30 July 2020, pp. 1150-1151
- Print publication: August 2020
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Atomic-scale Analysis of Mechanical Response of SrTiO3 by MEMS-based in Situ STEM Mechanical Testing
- Journal: Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press: 30 July 2020, pp. 1838-1840
- Print publication: August 2020
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Improving the Depth Resolution of HAADF Sectioning by 3D Deconvolution
- Journal: Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press: 30 July 2020, pp. 3110-3111
- Print publication: August 2020
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Light Element Imaging Technique at Low Dose Condition by Processing Simultaneously Obtained STEM Images Using a Segmented Detector
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 484-485
- Print publication: August 2019
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In situ STEM Mechanical Experiments at Atomic-Resolution Using a MEMS Device
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 1884-1885
- Print publication: August 2019
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Advanced Scanning Transmission Electron Microscopy as a Tool for Direct Real-Space Visualization and Artificial Control of Quantum Spin Textures
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 954-955
- Print publication: August 2019
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Iterative Algorithm of Atomic Potential Reconstruction Based on DPC Signal from Thick Specimens
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 60-61
- Print publication: August 2019
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Insights into fundamental deformation processes from advanced in situ transmission electron microscopy
- Journal: MRS Bulletin / Volume 44 / Issue 6 / June 2019
- Published online by Cambridge University Press: 11 June 2019, pp. 443-449
- Print publication: June 2019
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Resolution Achievement of 40.5 pm in Scanning Transmission Electron Microscopy using 300 kV Microscope with Delta Corrector
- Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press: 01 August 2018, pp. 120-121
- Print publication: August 2018
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Surface and Electric Field Imaging by Newly Designed Atomic-Resolution STEM
- Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press: 01 August 2018, pp. 118-119
- Print publication: August 2018
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Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials
- Journal: Microscopy Today / Volume 25 / Issue 6 / November 2017
- Published online by Cambridge University Press: 27 October 2017, pp. 36-41
- Print publication: November 2017
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Better Contrast for Imaging Defects by ABF
- Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press: 04 August 2017, pp. 480-481
- Print publication: July 2017
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Quantitative Relation Between Differential Phase Contrast Images Obtained by Segmented and Pixelated Detectors
- Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press: 04 August 2017, pp. 440-441
- Print publication: July 2017
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Interface and Surface Local Atomic Structures of Lithium Ion Battery Oxides
- Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press: 04 August 2017, pp. 1594-1595
- Print publication: July 2017
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Three-Dimensional Point Defect Imaging by Large-angle Illumination STEM
- Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press: 04 August 2017, pp. 424-425
- Print publication: July 2017
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Direct Visualization of the Grain Boundary Solute Segregation in Oxide Material at Atomic Resolution Using STEM-EDS
- Journal: Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press: 25 July 2016, pp. 1340-1341
- Print publication: July 2016
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Misalignment Induced Artifacts in Quantitative Annular Bright-Field Imaging
- Journal: Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press: 25 July 2016, pp. 888-889
- Print publication: July 2016
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