3 results
Analysis of failure of C-V characteristics of MIS structure with SiO2 passivation layer deposited on InSb substrate via Raman spectroscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1670 / 2014
- Published online by Cambridge University Press:
- 22 May 2014, mrss14-1670-h04-06
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- 2014
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Analysis of high-power packages for white-light-emitting diode lamps with remote phosphor
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- Journal:
- MRS Online Proceedings Library Archive / Volume 892 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, 0892-FF09-07
- Print publication:
- 2005
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Effect of crystallinity on the dielectric loss of sputter-deposited (Ba,Sr)TiO3 thin films in the microwave range
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- Journal:
- Journal of Materials Research / Volume 18 / Issue 3 / March 2003
- Published online by Cambridge University Press:
- 31 January 2011, pp. 682-686
- Print publication:
- March 2003
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