18 results
The use of neighbourhood intensity comparisons, morphological gradients and Fourier analysis for automated precipitate counting & Pendellösung fringe analysis in X-ray topography
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- Journal:
- The European Physical Journal - Applied Physics / Volume 27 / Issue 1-3 / July 2004
- Published online by Cambridge University Press:
- 15 July 2004, pp. 443-446
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- July 2004
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White Beam Synchrotron X-ray Topography and X-ray Diffraction Measurements of Epitaxial Lateral Overgrowth of GaN
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- Journal:
- MRS Online Proceedings Library Archive / Volume 693 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, I3.27.1
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- 2001
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Investigation of Mechanical Stresses in Underlying Silicon due to Lead-Tin Solder Bumps via Synchrotron X-Ray Topography and Finite Element Analysis
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- Journal:
- MRS Online Proceedings Library Archive / Volume 682 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, N5.7
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- 2001
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Defect Evolution in 4H-SiC Sublimation Epi-Layers Grown on LPE Buffers with Reduced Micropipe Density
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- MRS Online Proceedings Library Archive / Volume 640 / 2000
- Published online by Cambridge University Press:
- 21 March 2011, H2.1
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- 2000
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Synchrotron X-ray Topography Studies of Epitaxial Lateral Overgrowth of GaN on Sapphire
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- Journal:
- MRS Online Proceedings Library Archive / Volume 572 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 327
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- 1999
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Epitaxial Lateral Overgrowth of Gallium Arsenide Studied by Synchrotron Topography
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- MRS Online Proceedings Library Archive / Volume 570 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 181
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- 1999
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The Use of X-ray Topography to Map Mechanical, Thermomechanical and Wire-Bond Strain Fields in Packaged Integrated Circuits
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- Journal:
- MRS Online Proceedings Library Archive / Volume 505 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 241
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- 1997
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An Examination of the Crystalline Quality of 200mm Diameter Silicon Substrates using X-ray Topography
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- Journal:
- MRS Online Proceedings Library Archive / Volume 469 / 1997
- Published online by Cambridge University Press:
- 15 February 2011, 83
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- 1997
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Compound Semiconductor Detectors for X-Ray Astronomy: Spectroscopic Measurements and Material Characteristics
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- MRS Online Proceedings Library Archive / Volume 487 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 565
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- 1997
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Synchrotron x-Ray Topographic Study Of Dislocations In Gaas Detector Crystals Grown By Vertical Gradient Freeze Technique
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- Journal:
- MRS Online Proceedings Library Archive / Volume 487 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 459
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- 1997
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A Study Of The Composition Uniformity, Electrical And Spectroscopic Properties Of CdZnTe Detectors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 487 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 77
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- 1997
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Investigation of Structural Defects in 4H SiC Wafers
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- MRS Online Proceedings Library Archive / Volume 339 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 729
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- 1994
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Formation of Excess Donors During High-Dose 74Ge+ Ion Implantation
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- MRS Online Proceedings Library Archive / Volume 354 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 261
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- 1994
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Praseodymium Dioxide Doping of In1−xGaxAsyP1−y Epilayer Grown with Liquid Phase Epitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 301 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 27
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- 1993
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Thin film backside gettering in n-type (100) Czochralski silicon during simulated CMOS process cycles
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- Journal:
- Journal of Materials Research / Volume 4 / Issue 3 / June 1989
- Published online by Cambridge University Press:
- 31 January 2011, pp. 623-633
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- June 1989
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Effects of Pre-Gate Oxidation Intrinsic Gettering Upon Thin Gate Oxide Integrity In High Carbon Content CZ Si
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- MRS Online Proceedings Library Archive / Volume 105 / 1987
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- 22 February 2011, 103
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- 1987
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Oxygen Precipitation Studies for N-Type and Epitaxial Silicon Substrates During Simulated Cmos Cycles by Synchrotron Section Topography
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- MRS Online Proceedings Library Archive / Volume 71 / 1986
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- 28 February 2011, 47
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- 1986
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Synchrotron Section Topographic Study of the Denuded Zone Formation in Annealed Silicon
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- MRS Online Proceedings Library Archive / Volume 41 / 1984
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- 25 February 2011, 101
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- 1984
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