5 results
Focused Helium Ion Beam Nanomachining of Thin Membranes vs. Bulk Substrates
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 336-337
- Print publication:
- August 2014
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A Study of Helium Ion Beam Substrate Interaction Volume on Nanomachining Profiles in Bulk Substrates and Thin Film Membranes
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 808-809
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- July 2012
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Focused Ion Beam Circuit Edit–A Look into the Past, Present, and Future
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 672-673
- Print publication:
- July 2011
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The Neon Gas Field Ion Source - Stability and Lifetime
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 28-29
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- July 2010
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An Early Report on Iue Observations of the Impact of Comet Shoemaker-Levy With Jupiter
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- Journal:
- Highlights of Astronomy / Volume 10 / 1995
- Published online by Cambridge University Press:
- 30 March 2016, pp. 636-637
- Print publication:
- 1995
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