14 results
The Beauty and Clarity of a Well Designed Experiment
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2738-2740
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- August 2022
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Interpretation of meV Resolution Phonon EELS Data
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 412-413
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- August 2018
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Exploring Phonon Signals by High Energy / High Spatial Resolution EELS
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 66-67
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- August 2014
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High Energy Resolution Monochromated EELS-STEM System
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1124-1125
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- August 2013
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Monochromated STEM with high energy and spatial resolutions
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 330-331
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- July 2012
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Electron Microscopy Enters a New Era Using Aberration Correction
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- Journal:
- Microscopy Today / Volume 12 / Issue 1 / January 2004
- Published online by Cambridge University Press:
- 14 March 2018, pp. 8-13
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- January 2004
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High Resolution Spectrometer Coupling to the Sub-Å IBM STEM
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 836-837
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- August 2003
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Sub-Angstrom Probe Size in HADF-STEM at 120KV
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 November 2002, pp. 14-15
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- August 2002
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Aberration-Corrected STEM: the Present and the Future
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 896-897
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- August 2001
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Bandstructure Near Misfit Dislocations in Si Quantum Wells
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 794-795
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- July 1998
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Atomic Resolution Electronic Structure in Device Development
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 645-646
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- August 1997
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Atomic scale oxide superlattices grown by RHEED controlled pulsed laser deposition
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- Journal:
- Journal of Materials Research / Volume 9 / Issue 10 / October 1994
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- 03 March 2011, pp. 2566-2573
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- October 1994
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Atomic Resolution Electronic Structure Using Spatially Resolved Electron Energy Loss Spectroscopy
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- MRS Online Proceedings Library Archive / Volume 332 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 275
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- 1994
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Experimental Measurement of the Local Electronic Structure of Grain Boundaries in Ni3Al
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- Journal:
- MRS Online Proceedings Library Archive / Volume 319 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 299
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- 1993
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