7 results
Atom Probe Tomography for Isotopic Analysis: Development of the 34S/32S System in Sulfides
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue 4 / August 2022
- Published online by Cambridge University Press:
- 12 November 2021, pp. 1127-1140
- Print publication:
- August 2022
-
- Article
- Export citation
Complementary SEM-EDS / FIB-SEM Sample Preparation Techniques for Atom Probe Tomography of nanophase-Fe0 in Apollo 16 Regolith Sample 61501,22
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2544-2545
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
Atom Probe Tomography of Reduced Phases in Apollo 16 Regolith Sample 61501,22
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 720-721
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Survey for Fe-Si in Apollo 16 Regolith Sample 61501,22
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2095-2096
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Soft X-Ray EPMA Analyses of Extremely Reduced Phases from Apollo 16 Regolith: Problems and Solutions for Sub-Micron Analysis
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 698-699
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation
Random Spectrometer Motion for Removal of Time Dependent Artifacts in Spectroscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 814-815
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Soft X-ray EPMA of submicron phase lunar Fe-Si compounds
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1728-1729
- Print publication:
- July 2012
-
- Article
- Export citation