4 results
Analytical TEM Characterization of Source/Drain Contacts in Advanced Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 8-9
- Print publication:
- August 2018
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Structural and Chemical Characterization of Tungsten Gate Stack for 1 Gb Dram
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- Journal:
- MRS Online Proceedings Library Archive / Volume 611 / 2000
- Published online by Cambridge University Press:
- 14 March 2011, C3.3.1
- Print publication:
- 2000
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Growth and Characterization of AlGaN/GaN Heterostructures with Multiple Quantum Wells by PAMBE
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- Journal:
- MRS Online Proceedings Library Archive / Volume 423 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 347
- Print publication:
- 1996
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High Quality P-Type Gan Films Grown By Plasma-Assistedmolecular Beam Epitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 423 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 385
- Print publication:
- 1996
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