13 results
Subcritical Debonding of Multilayer Interconnect Structures: Temperature and Humidity Effects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 563 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 251
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- 1999
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Interfacial Diffusivity of Moisture Along A SiO2/Tin Interface Measured Using Imaging Secondary Ion Mass Spectroscopy (SIMS)
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- MRS Online Proceedings Library Archive / Volume 563 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 257
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- 1999
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Measurement of Toughness for Sin Films on Silicon Using Channel Cracking Technique
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- MRS Online Proceedings Library Archive / Volume 563 / 1999
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- 10 February 2011, 285
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- 1999
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Polymer/metal Interfaces in Interconnect Structures: Moisture Diffusion and Stress Corrosion Effects
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- MRS Online Proceedings Library Archive / Volume 511 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 329
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- 1998
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Channel Cracking Technique for Toughness Measurement of Brittle Dielectric Thin Films on Silicon Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 516 / January 1998
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- 10 February 2011, 331
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- January 1998
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Debonding of Interfaces in Multilayer Interconnect Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 514 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 141
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- 1998
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Progressive Debonding of Multilayer Interconnect Structures
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- MRS Online Proceedings Library Archive / Volume 473 / 1997
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- 10 February 2011, 21
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- 1997
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Adhesion Measurement of Interfaces in Multilayer Interconnect Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 473 / 1997
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- 10 February 2011, 3
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- 1997
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Effects of Interface Nonplanarity on the Interface Fracture Energy of the TiN/SiO2System
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- MRS Online Proceedings Library Archive / Volume 505 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 357
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- 1997
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Measurement of Low-k Polymerimetal Interfacial Toughness Using 4-point Bending Method
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- MRS Online Proceedings Library Archive / Volume 436 / 1996
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- 15 February 2011, 379
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- 1996
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Quantitative Measurement of Interface Fracture Energy in Multi-Layer Thin Film Structures
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- MRS Online Proceedings Library Archive / Volume 391 / 1995
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- 15 February 2011, 91
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- 1995
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Measurement and Modeling of Intrinsic Stresses in CVD W Lines
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- Journal:
- MRS Online Proceedings Library Archive / Volume 391 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 115
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- 1995
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Optical Interconnect: Fully Embedded Etched Passive And Active Polyimide Waveguides And Devices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 328 / 1993
- Published online by Cambridge University Press:
- 16 February 2011, 553
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- 1993
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