11 results
Liftout of High-Quality Thin Sections of a Perovskite Oxide Thin Film Using a Xenon Plasma Focused Ion Beam Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue 1 / February 2019
- Published online by Cambridge University Press:
- 30 January 2019, pp. 115-118
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- February 2019
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Low Dose Imaging Using Simultaneous iDPC- and ADF-STEM for Beam Sensitive Crystalline Structures
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 122-123
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- August 2018
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Thick (3D) Sample Imaging Using iDPC-STEM at Atomic Scale
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 170-171
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- August 2018
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Simultaneous iDPC and ADF STEM Imaging at the Limit of Contrast and Resolution
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 214-215
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- August 2018
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Thick (3D) Sample STEM Imaging at Nano Scale: iDPC and ADF Simultaneously
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 226-227
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- August 2018
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Soft Matter X-ray Microanalysis in the Analytical Electron Microscope
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 776-777
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- August 2018
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Quantitative Phase Imaging of Ba2NaNb5O15
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1458-1459
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- July 2016
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Performance Evaluation of Dual Bruker XFlash6 | 100 EDS Detector Integrated in FEI Themis With Analytical Objective Pole Piece
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 52-53
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- July 2016
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Integrated Differential Phase Contrast (iDPC)–Direct Phase Imaging in STEM for Thin Samples
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 36-37
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- July 2016
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Aberration Corrected Off-Axis Electron Holography of Layered Transition Metal Dichalcogenides
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1399-1400
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- August 2015
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Still “Plenty of Room at the Bottom” for Aberration-Corrected TEM
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- Microscopy Today / Volume 19 / Issue 3 / May 2011
- Published online by Cambridge University Press:
- 28 April 2011, pp. 10-14
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- May 2011
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